AFM Probes » HQ:NSC35/No Al

HQ:NSC35/No Al

AFM Probe with 3 Different Tapping Mode Cantilevers

Coating: None
Tip shape: Rotated
This probe features 3 cantilevers
F 205 kHz
C 8.9 N/m
L 110 µm
F 300 kHz
C 16 N/m
L 90 µm
F 150 kHz
C 5.4 N/m
L 130 µm
*nominal values
Probes of the 35 series have three different tapping mode cantilevers on one side of the holder chip. They can be used in various applications.
Uncoated

AFM Tip:

  • Rotated
  • 15 µm (12 - 18 µm)*
  • < 8 nm
  • 40°
  • AFM Cantilevers:

    Cantilever A
  • Beam
  • 110 µm
  • 35 µm
  • 2 µm
  • 8.9 N/m (2.7 - 24 N/m)*
  • 205 kHz (130 - 290 kHz)*
  • Cantilever B
  • Beam
  • 90 µm
  • 35 µm
  • 2 µm
  • 16 N/m (4.8 - 44 N/m)*
  • 300 kHz (185 - 430 kHz)*
  • Cantilever C
  • Beam
  • 130 µm
  • 35 µm
  • 2 µm
  • 5.4 N/m (1.7 - 14 N/m)*
  • 150 kHz (95 - 205 kHz)*
  • * typical range

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