AFM Probes » HQ:NSC36/Co-Cr/Al BS

HQ:NSC36/Co-Cr/Al BS

Hard Magnetic, Medium Momentum AFM Probe with 3 Different Cantilevers

Coating: Magnetic
Tip shape: Rotated
This probe features 3 cantilevers
F 60 kHz
C 1 N/m
L 110 µm
F 130 kHz
C 2 N/m
L 90 µm
F 65 kHz
C 0.6 N/m
L 130 µm
*nominal values
Probes of the 36 series have three different force modulation mode cantilevers on one side of the holder chip.

The coating consists of a Co layer on the tipside of the cantilever. The Co layer is formed as a polycrystalline film, which allows steady permanent magnetization in the direction of the tip axis. All chips are pre-magnetized at the facility before shipping to end users. In some cases additional magnetization by an arbitrary strong magnet is required, e.g. SmCo or NdFeB.

The Co coating is protected from oxidation by a thin Cr layer, resulting in longer cantilever performance.
Co and Cr layer on the tipside of the cantilever. Aluminum coating with thickness 30 nm on the backside of the cantilever.

AFM Tip:

  • Rotated
  • 15 µm (12 - 18 µm)*
  • < 60 nm
  • 40°
  • AFM Cantilevers:

    Cantilever A
  • Beam
  • 110 µm
  • 32.5 µm
  • 1 µm
  • 1 N/m (0.1 - 4.6 N/m)*
  • 60 kHz (30 - 160 kHz)*
  • Cantilever B
  • Beam
  • 90 µm
  • 32.5 µm
  • 1 µm
  • 2 N/m (0.2 - 9 N/m)*
  • 130 kHz (45 - 240 kHz)*
  • Cantilever C
  • Beam
  • 130 µm
  • 32.5 µm
  • 1 µm
  • 0.6 N/m (0.06 - 2.7 N/m)*
  • 65 kHz (25 - 115 kHz)*
  • * typical range

    Give us your feedback

    Did we miss any relevant information of this product?
    Did you find this or a comparable product for a better price?