AFM Probes » HQ:XSC11/Al BS

HQ:XSC11/Al BS

AFM Probe with 4 Different Cantilevers for Various Applications

Coating: Reflex Aluminum
Tip shape: Rotated
This probe features 4 cantilevers
F 15 kHz
C 0.2 N/m
L 500 µm
F 80 kHz
C 2.7 N/m
L 210 µm
F 155 kHz
C 7 N/m
L 150 µm
F 350 kHz
C 42 N/m
L 100 µm
*nominal values
Probes of the 11 series have four different cantilevers, two on each side of the holder chip. They can be used in various applications.
Backside Al coated. Coating thickness - 30 nm.

AFM Tip:

  • Rotated
  • 15 µm (12 - 18 µm)*
  • < 8 nm
  • 40°
  • AFM Cantilevers:

    Cantilever A
  • Beam
  • 0.2 N/m (0.1 - 0.4 N/m)*
  • 15 kHz (12 - 18 kHz)*
  • 500 µm (495 - 505 µm)*
  • 30 µm (27 - 33 µm)*
  • 2.7 µm (2.2 - 3.2 µm)*
  • Cantilever B
  • Beam
  • 2.7 N/m (1.1 - 5.6 N/m)*
  • 80 kHz (60 - 100 kHz)*
  • 210 µm (205 - 215 µm)*
  • 30 µm (27 - 33 µm)*
  • 2.7 µm (2.2 - 3.2 µm)*
  • Cantilever C
  • Beam
  • 7 N/m (3 - 16 N/m)*
  • 155 kHz (115 - 200 kHz)*
  • 150 µm (145 - 155 µm)*
  • 30 µm (27 - 33 µm)*
  • 2.7 µm (2.2 - 3.2 µm)*
  • Cantilever D
  • Beam
  • 42 N/m (17 - 90 N/m)*
  • 350 kHz (250 - 465 kHz)*
  • 100 µm (95 - 105 µm)*
  • 50 µm (45 - 55 µm)*
  • 2.7 µm (2.2 - 3.2 µm)*
  • * typical range

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