News » NanoAndMore USA announces introduction of NANOSENSORS™ self-sensing self-actuating Akiyama-probe

Lady's Island, South Carolina, November 11, 2008

NanoAndMore USA today announced the introduction of NANOSENSORS™'s new self-sensing self-actuating Akiyama-probe.


Akiyama-probe

The Akiyama-probe has been developed in cooperation with the Institute of Microtechnology (IMT) at the University of Neuchâtel for the NANOSENSORS™ brand that is specialized on cutting edge scanning probes for Atomic Force Microscopy (AFM) applications. The product is called the Akiyama-probe or A-probe to honour its inventor Dr. Terunobu Akiyama. It is a novel self-sensing and – actuating probe based on a quartz tuning fork combined with a micromachined cantilever for dynamic mode AFM.

It features a symmetrical arrangement of a U-shaped silicon cantilever attached to the two prongs of a quartz tuning fork. The tuning fork serves as an oscillatory force sensor that governs the tip vibration frequency as well as the amplitude and ensures a high mechanical Q-factor. The force constant of the probe is determined by the cantilever and can be adjusted independently from the resonance frequency.

The Akiyama-probe requires neither optical detection, nor an external shaker. A-Probe occupies only a small volume above the sample. These features make it very attractive for creating a new generation of scanning probe microscopy (SPM) instruments.

Up to now the probe was only available to and via AFM manufacturers who sell instruments with A-probe capability. Now the Akiyama-probe is also offered to end-customers by NanoAndMore USA Corp.

For this occasion NANOSENSORS™ has dedicated a complete website www.akiyamaprobe.com which offers ample information on this very special product.