News » NANOSENSORS™ Q30K-Plus Silicon AFM probes for UHV applications now available

Neuchâtel, January 27, 2006

The new NANOSENSORSQ30K-Plus AFM tip with a very high Q-factor and an enhanced signal to noise ratio for UHV applications was introduced today.

Q30K-Plus scanning proximity probe with a very high Q-factor and an enhanced signal to noise ratio for UHV applications

The new NANOSENSORSQ30K-Plus AFM tip with a very high Q-factor and an enhanced signal to noise ratio for UHV applications was introduced today.

Based on the well-known PointProbe® Plus AFM probe NANOSENSORS™ has developed the Q30K-Plus SPM-probe series especially for UHV applications. For high sensitivity and a good signal to noise ratio the new probes are featuring a Q-factor of over 30 000 (up to 50 000) under UHV conditions and a high reflectivity (even at wavelength of over 800 nm).

In addition to the enhanced Q-factor and the optimized signal to noise ratio
the Q30K-Plus series offers all features of the PointProbe® plus series like a minimized variation in tip shape and a typical tip radius of less than 7 nm.

The Q30K-Plus™ AFM probe is available in the following types and package sizes:

PPP-QNCHR-10 for Non-Contact Mode/Tapping Mode
  • Typical Values:
  • Force Constant = 42 N/m
  • Resonance Frequency = 330 kHz
  • Cantilever Length = 125 µm
  • Cantilever Width = 30 µm
  • Quality Factor = 30000
  • Packages of 10 probes
PPP-QFMR-10 for Force Modulation Mode
  • Typical Values:
  • Force Constant = 2.8 N/m
  • Resonance Frequency = 75 kHz
  • Cantilever Length = 225 µm
  • Cantilever Width = 28 µm
  • Quality Factor = 30000
  • Packages of 10 probes