AFM Accessories » Lateral Calibration Standards

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Lateral-(xy)-Calibration Standard (2D200)

Lateral-(xy)-Calibration Standard (2D200)
Standard for Precise Lateral Calibration with 200 nm Pitch
price:
$1 300.00
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TGXYZ02

TGXYZ02
XYZ Calibration Grating, 100nm Step Height, 5µm and 10µm Pitch
Various purchasing options »
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TGX

TGX
Grating with Undercut Edge Structures for Lateral Calibration and Tip Aspect Ratio Determination
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CS-20NG

CS-20NG
XYZ Calibration Nanogrid; Arrays with Down to 500nm Pitch; 20nm Height
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TGXYZ01

TGXYZ01
XYZ Calibration Grating, 20nm Step Height, 5µm and 10µm Pitch
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TGF11

TGF11
Grating with Trapezoid Structures for Lateral Force Calibration and Scanner Nonlinearity Assessment
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TGXYZ03

TGXYZ03
XYZ Calibration Grating, 500nm Step Height, 5µm and 10µm Pitch
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300-2D

300-2D
Calibration specimen, 2-dimensional, 297 nm nominal period, Aluminum bumps on Si
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145TC

145TC
Traceable Calibration Specimen, 1-dimensional, 144 nm nominal period, Al on glass.
price:
$4 159.00
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302-edu

302-edu
Student grade Calibration specimen, 2-dimensional, 297 nm nominal period, Aluminum bumps on Si
price:
$441.00
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150-1D

150-1D
Calibration Specimen, 1-dimensional, 144 nm nominal period, Al on glass.
price:
$750.00
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150-2D

150-2D
Calibration Specimen, 2-dimensional, 144 nm nominal period, Al on Si
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300-1D

300-1D
Calibration Specimen, 1-dimensional, 288 nm nominal period, W-coated Photoresist on Si
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301BE

301BE
Calibration Specimen, 1-dimensional, 292 nm nominal period, Ti on Si
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70-1D

70-1D
Calibration Specimen, 1-dimensional, 70 nm nominal period, HSQ resist (silicon oxide) on Si.
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700-1D

700-1D
Calibration Specimen, 1-dimensional, 700 nm nominal period, W-coated Photoresist on Si
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700-2D

700-2D
Calibration specimen, 2-dimensional, 700 nm nominal period, W-coated Photoresist on Si
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750-HD

750-HD
750-HD Calibration specimen, 1-Dimensional with Height, 750 nm period, 100 nm height
price:
$341.00
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751-HD

751-HD
Nickel NanoChannel Array Substrate. Width 370 nm, depth 180 nm
price:
$107.00