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AFM Accessories
» Lateral Calibration Standards
Lateral Calibration Standards
Height Calibration Standards
Other Calibration Artifacts
HOPG
ESD Kit
Electronic Devices
product details »
Lateral-(xy)-Calibration Standard (2D200)
Standard for Precise Lateral Calibration with 200 nm Pitch
price:
1300
2D200
$1 300.00
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product details »
TGXYZ02
XYZ Calibration Grating, 100nm Step Height, 5µm and 10µm Pitch
Various purchasing options »
product details »
TGX
Grating with Undercut Edge Structures for Lateral Calibration and Tip Aspect Ratio Determination
Various purchasing options »
product details »
CS-20NG
XYZ Calibration Nanogrid; Arrays with Down to 500nm Pitch; 20nm Height
Various purchasing options »
product details »
TGXYZ01
XYZ Calibration Grating, 20nm Step Height, 5µm and 10µm Pitch
Various purchasing options »
product details »
TGF11
Grating with Trapezoid Structures for Lateral Force Calibration and Scanner Nonlinearity Assessment
Various purchasing options »
product details »
TGXYZ03
XYZ Calibration Grating, 500nm Step Height, 5µm and 10µm Pitch
Various purchasing options »
product details »
300-2D
Calibration specimen, 2-dimensional, 297 nm nominal period, Aluminum bumps on Si
Various purchasing options »
product details »
145TC
Traceable Calibration Specimen, 1-dimensional, 144 nm nominal period, Al on glass.
price:
4159
145TC
$4 159.00
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product details »
302-edu
Student grade Calibration specimen, 2-dimensional, 297 nm nominal period, Aluminum bumps on Si
price:
441
302-edu
$441.00
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product details »
150-1D
Calibration Specimen, 1-dimensional, 144 nm nominal period, Al on glass.
price:
750
150-1D
$750.00
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product details »
150-2D
Calibration Specimen, 2-dimensional, 144 nm nominal period, Al on Si
Various purchasing options »
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300-1D
Calibration Specimen, 1-dimensional, 288 nm nominal period, W-coated Photoresist on Si
Various purchasing options »
product details »
301BE
Calibration Specimen, 1-dimensional, 292 nm nominal period, Ti on Si
Various purchasing options »
product details »
70-1D
Calibration Specimen, 1-dimensional, 70 nm nominal period, HSQ resist (silicon oxide) on Si.
Various purchasing options »
product details »
700-1D
Calibration Specimen, 1-dimensional, 700 nm nominal period, W-coated Photoresist on Si
Various purchasing options »
product details »
700-2D
Calibration specimen, 2-dimensional, 700 nm nominal period, W-coated Photoresist on Si
Various purchasing options »
product details »
750-HD
750-HD
Calibration specimen, 1-Dimensional with Height, 750 nm period, 100 nm height
price:
341
750-HD
$341.00
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product details »
751-HD
Nickel NanoChannel Array Substrate. Width 370 nm, depth 180 nm
price:
107
751-HD
$107.00
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