AFM Probe Info » AFM Cantilevers: AFM Cantilever Types

AFM Cantilevers by Shape

AFM Cantilevers by Shape (Top View)

Single Beam Cantilevers

Pyrex-Nitride Diving Board AFM Cantilever
Pyrex-Nitride Diving Board
AFM Cantilever

Rectangular AFM cantilevers with various dimensions for specific applications.
(see Interdependence between Geometry and Application)

Typical AFM cantilever mechanical properties ranges:

  • AFM cantilever force constant: 0.06 to 50 N/m
  • AFM cantilever resonance frequency: 1 kHz to 1 MHz
  • AFM cantilever length:  100 to 500 µm
  • AFM cantilever width: 30 to 50 µm
  • AFM cantilever thickness: 0.5 to 8 µm
» Browse all AFM probes with rectangular AFM cantilevers
HQ:NSC18/Al BS

HQ:NSC18/Al BS

Standard Force Modulation AFM Probe
Coating: Reflex Aluminum
Tip shape: Rotated
Cantilever:
F 75 kHz
C 2.8 N/m
L 225 µm

Double Beam Cantilevers

Akiyama-Probe AFM Cantilever
Akiyama-Probe
AFM Cantilever

AFM cantilevers with two beams running parallel to each other.

  • AFM cantilever geometry currently used for Akiyama-Probe AFM cantilevers
  • AFM cantilever length: 310 µm
  • AFM cantilever thickness: 3.7 µm
  • AFM cantilever width: 30 µm each
» NANOSENSORS Akiyama-Probe
Akiyama-Probe

Akiyama-Probe

Novel self-sensing, self-actuating AFM probe for intermittent contact

Coating: None
Tip shape: Visible
Cantilever:
F 50 kHz
C 5 N/m
L 310 µm
Pyrex-Nitride Triangular AFM Cantilever
Pyrex-Nitride
Triangular AFM Cantilever

V-shaped AFM cantilever geometry with two identical legs.

Typical triangular AFM cantilever mechanical properties ranges:

  • AFM cantilever force constant: 0.08 to 0.3 N/m
  • AFM cantilever resonance frequency: 10 to 70 Khz
  • AFM cantilever length: 100 to 200 µm
  • AFM cantilever width: 10 to 30 µm
  • AFM cantilever thickness: 0.5 to 0.6 µm
» Browse all AFM probes with triangular AFM cantilevers
PNP-TRS

PNP-TRS

Silicon Nitride AFM Probe Single Cantilever Compatible with ScanAsyst® Mode

Coating: Reflex Gold
Tip shape: Pyramid
Cantilever:
F 67 kHz
C 0.32 N/m
L 100 µm

AFM Cantilevers by Shape (Cross Section)

AFM Cantilevers by Material

Arrow™ AFM Cantilever
Arrow™ AFM Cantilever

AFM cantilevers made of single crystal silicon.

  • All components of the AFM probe: the AFM tip, the AFM cantilever and the AFM support are made of monolithic single crystal silicon
  • Silicon is highly doped for static charge dissipation
» Browse all AFM probes with silicon AFM cantilevers
240AC-PP

240AC-PP

Electrical, Force Modulation AFM Probe with Tip at the Very End of the Cantilever
Coating: Electrically Conductive
Tip shape: OPUS
Cantilever:
F 70 kHz
C 2 N/m
L 240 µm
Pyrex-Nitride AFM Cantilevers
Pyrex-Nitride
AFM Cantilevers

AFM cantilevers made of silicon nitride.

  • The AFM tip and the AFM cantilever are made of silicon nitride
  • The AFM cantilever is attached to a silicon or borosilicate glass support chip
» Browse all AFM probes with silicon nitride AFM cantilevers
CP-PNP-Au

CP-PNP-Au

Colloidal probe, AFM cantilever with round tip like a ball.
Coating: Reflex Gold
Tip shape: Sphere
This probe features 2 cantilevers
F 67 kHz
C 0.32 N/m
L 100 µm
F 17 kHz
C 0.08 N/m
L 200 µm

AFM Cantilevers by Number of Cantilevers per AFM Probe

AFM Cantilevers by Coating

Rotated AFM Tip
AFM Cantilever with
Aluminum Reflex coating

Aluminum coating on the detector facing side of the AFM cantilevers for enhanced laser reflectance.

Reflectance of an uncoated AFM cantilever vs reflectance of an aluminum coated AFM cantilever:

Rotated AFM Tip Rotated AFM Tip
Reflectance of an uncoated AFM Cantilever Reflectance of Aluminum coated AFM Cantilever


» Browse all AFM probes with backside aluminum coated AFM cantilevers
PPP-RT-NCHR

PPP-RT-NCHR

Standard Tapping Mode AFM Probe
Coating: Reflex Aluminum
Tip shape: Rotated
Cantilever:
F 330 kHz
C 42 N/m
L 125 µm
AFM Cantilever with Gold Reflex Coating
AFM Cantilever with Gold Reflex Coating

Gold coating on the detector facing side of the AFM cantilevers for enhanced laser reflectance in ambient atmosphere and chemically aggressive environments.

Reflectance of an uncoated AFM cantilever vs reflectance of a gold coated AFM cantilever:

Rotated AFM Tip Rotated AFM Tip
Reflectance of an uncoated AFM Cantilever Reflectance of a Gold coated AFM Cantilever
» Browse all AFM probes with backside gold coated AFM cantilevers
qp-BioAC

qp-BioAC

uniqprobe™ - uniform quality SPM probe for non-contact/tapping mode/contact mode with 3 different cantilevers

Coating: Reflex Gold
Tip shape: Circular symmetric
This probe features 3 cantilevers
F 90 kHz
C 0.3 N/m
L 40 µm
F 50 kHz
C 0.1 N/m
L 60 µm
F 30 kHz
C 0.06 N/m
L 80 µm
AFM Cantilever with Overall Gold Coating
AFM Cantilever with
Overall Gold Coating

Gold coating on both sides of the AFM cantilevers.

  • Electrically conductive
  • Often used for tip functionalization
  • Protects the cantilever in chemically aggressive measurement environments
» Browse all AFM probes with overall gold coated AFM cantilevers
160AC-FG

160AC-FG

High Aspect Ratio, Tapping Mode AFM Probe
Coating: Reflex Gold
Tip shape: High-Aspect-Ratio
Cantilever:
F 300 kHz
C 26 N/m
L 160 µm
AFM Cantilever with Electrically Conductive Platinum/Iridium Coating
AFM Cantilever with
Electrically Conductive
Platinum/Iridium Coating

Platinum/Iridium coating on both sides of the AFM cantilevers.

  • Enhances laser reflectance
  • Electrically conductive
  • Used for electric mode measurements
» Browse all AFM probes with platinum/iridium coated AFM cantilevers
ATEC-CONTPt

ATEC-CONTPt

Electrical, Contact Mode AFM Probe with REAL Tip Visibility
Coating: Electrically Conductive
Tip shape: Visible
Cantilever:
F 15 kHz
C 0.2 N/m
L 450 µm
AFM Cantilever with Conductive Diamond Coating
AFM Cantilever with
Conductive Diamond Coating

High wear resistance and electrically conductive real doped diamond coating on the tip side of the AFM cantilevers.

  • Electrically conductive
  • Used fo electric mode measurements
  • Detector facing side of the AFM cantilevers is coated with aluminum
» Browse all AFM probes with conductive diamond coated AFM cantilevers
CDT-FMR

CDT-FMR

Diamond Coated, Conductive Force Modulation AFM Probe
Coating: Diamond,
Conductive Diamond
Tip shape: Standard
Cantilever:
F 105 kHz
C 6.2 N/m
L 225 µm


Note: Other coating materials can cover the cantilevers, but as they do not play an active role in the measurement, they have not been listed above.