AFM probes with one or more cantilevers without an AFM tip.
» Browse all AFM probes with tipless AFM cantileversTipless AFM Probe with 4 Different Cantilevers for Various Applications
AFM probes with very short, narrow and thin cantilevers with Electron Beam Deposited AFM tips for High Speed Scanning.
» Browse all AFM probes with ultra-short cantileversAFM probe for measuring electro-chemical reactions such as redox reactions, corrosion and dissolution of materials.
Tip: Silicon / SiO2 / Pt / SiN
Cantilevers: Silicon / SiO2 / Pt / SiN
Tip radius of curvature < 40 nm
AFM probe that requires neither an external piezo actuator, nor optical detection.
Novel self-sensing, self-actuating AFM probe for dynamic mode AFM
AFM probe showing an AFM cantilever with an integrated resistance thermometer for thermal mapping in contact mode.
AFM probes with extra tall tips (>30 microns) for measurements on very rough surfaces and for custom applications.
Bi-modal AFM cantilevers for higher harmonic operation allow collecting information about the mechanical properties of the sample material.
» Bi-modal AFM probes