Tipless AFM Probe

AFM probes with one or more cantilevers without an AFM tip.

Ultra-Short
AFM Cantilever

AFM probes with very short, narrow and thin cantilevers with Electron Beam Deposited AFM tips for High Speed Scanning.

Electro-Chemical Probe

AFM probe for measuring electro-chemical reactions such as redox reactions, corrosion and dissolution of materials.

Tip: Silicon / SiO_² / Pt / SiN
Cantilevers: Silicon / SiO_² / Pt / SiN
Tip radius of curvature < 40 nm

Akiyama-Probe

AFM probe that requires neither an external piezo actuator, nor optical detection.

• Based on a quartz tuning fork combined with micromachined cantilever
• Benefits from both the tuning fork's stable oscillation and the silicon cantilever's reasonable spring constant

Scanning Thermal
Microscopy Cantilever

AFM probe showing an AFM cantilever with an integrated resistance thermometer for thermal mapping in contact mode.

• Tip can be heated to map thermal conductivity on passive samples or biased to measure local hotspots
• Other applications include applying single point voltages, providing local current stimulus, or detecting thermal properties resulting in cantilever deflections

Extra Tall
PointProbePlus Tip

AFM probes with extra tall tips (>30 microns) for measurements on very rough surfaces and for custom applications.

• Extra-tall PointProbePlus Tips
• Extra-tall ATEC Tips

AFM Cantilever for
Higher Harmonic Operation

Bi-modal AFM cantilevers for higher harmonic operation allow collecting information about the mechanical properties of the sample material.