Special AFM probes classification

Tipless AFM Probe

AFM probes with one or more cantilevers without an AFM tip.

» Browse all AFM probes with tipless AFM cantilevers

ARROW-TL8

Tipless AFM Cantilever Array for Special Applications

Coating: None
Tip shape: Tipless

This probe features 8 cantilevers

F 6 kHz

C 0.03 N/m

L 500 µm

Ultra-Short
AFM Cantilever

AFM probes with very short, narrow and thin cantilevers with Electron Beam Deposited AFM tips for High Speed Scanning.

» Browse all AFM probes with ultra-short cantilevers

USC-F1.5-k0.6

Ultra-Short Cantilever (USC) mainly dedicated to High-Speed AFM applications in liquid

Coating: Reflex Gold
Tip shape: Cone Shaped, EBD

Electro-Chemical Probe

AFM probe for measuring electro-chemical reactions such as redox reactions, corrosion and dissolution of materials.

Tip: Silicon / SiO_² / Pt / SiN
Cantilevers: Silicon / SiO_² / Pt / SiN
Tip radius of curvature < 40 nm

» Electro-chemical probe

Special Developments

Not available in the standard scope of products

Coating: various
Tip shape: various

Cantilever:
Cantilever: various

Akiyama-Probe

AFM probe that requires neither an external piezo actuator, nor optical detection.

Based on a quartz tuning fork combined with micromachined cantilever
Benefits from both the tuning fork's stable oscillation and the silicon cantilever's reasonable spring constant

» Akiyama-Probe

Akiyama-Probe

Novel self-sensing, self-actuating AFM probe for intermittent contact

Coating: None
Tip shape: Visible

Scanning Thermal
Microscopy Cantilever

AFM probe showing an AFM cantilever with an integrated resistance thermometer for thermal mapping in contact mode.

Tip can be heated to map thermal conductivity on passive samples or biased to measure local hotspots
Other applications include applying single point voltages, providing local current stimulus, or detecting thermal properties resulting in cantilever deflections

» Thermal AFM probe