PPP-CONTSCR datasheet
AFM Probe Type:
PPP-CONTSCR 
Product Description:
The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
The NANOSENSORS™ PPP-CONTSCR is an alternative cantilever type for contact mode applications. The length of cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode probes for some AFM instruments. Additionally, this probe type allows the application for lateral or friction force mode.
The probe offers unique features:
- excellent tip radius of curvature
- highly doped to dissipate static charge
- Al coating on detector side of cantilever
- high mechanical Q-factor for high sensitivity
- precise alignment of the cantilever position (within +/- 2 µm) in conjunction with the usage of the
alignment chip
- compatible with PointProbe® Plus XY-Alignment Series
This product features alignment grooves on the backside of the holder chip.
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Cant. | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| 1 | 225 µm(215 - 235 µm)* | 48 µm(40 - 55 µm)* | 1 µm(0.1 - 2 µm)* | 0.2 N/m(0.01 - 1.87 N/m)* | 23 kHz(1 - 57 kHz)* |
AFM Tips:
| on Cant. | Shape | Tip Radius |
|---|---|---|
| 1 | Standard | <7 nm( < 10 nm guaranteed ) |
* guaranteed range
Coating:
Purchasing Info:
Product Availability: |
From stock |
Price Description: |
Does not include VAT or customs duties. |
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