AFM Probe Type: PPP-NCLAu

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Manufacturer: NANOSENSORS (www.nanosensors.com)

Call us: + 49 (0) 6441 870 6272 Wetzlar, Germany
- + 49 (0) 6 441 870 6 272
- + 49 (0) 6 441 870 6 274
- info@nanoandmore.com
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Order Code / Price, EUR	Probes per set
PPP-NCLAu-10	10 pcs
€ 331.00*

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* Does not include VAT or customs duties.
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manufacturer's website nanosensors.com

Learn more about this and other
AFM Tips

Learn more about this and other
AFM Cantilevers

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Long Tapping Mode AFM Cantilevers

Product Description:

The PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a more reproducible tip radius as well as a more defined tip shape. The minimized variation in tip shape provides more reproducible images.

NANOSENSORS™ PPP-NCLAu probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). The NCL type is offered as an alternative to NANOSENSORS™ high frequency non contact type (NCH). PPP-NCLAu is recommended if the feedback loop of the microscope does not accept high frequencies (400kHz) or if the detection system needs a minimum cantilever length >125µm. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

    The probe offers unique features:
- metallic conductivity of the tip
        - Au coating on both sides of the cantilever
        - chemically inertPlease note: Wear at the tip can occur if operating in contact-, friction- or force modulation mode.

Application Modes:

AFM Probe Specifications:

AFM Tips:

cant.	shape	tip height	tip set back	tip radius	full cone angle	half cone angle
	Standard	0 µm	0 - 0 µm*	0 µm (0 - 0 µm)*

AFM Cantilever(s):

cant.	shape	length	width	thickness	force const.	res. freq.	probe base
	beam	225 µm (215 - 235 µm)*	38 µm (30 - 45 µm)*	7 µm (6 - 8 µm)*	48 N/m (21 - 98 N/m)*	190 kHz (146 - 236 kHz)*

* guaranteed range

Coating:

A metallic layer (Au) is coated on both sides of the cantilever. The tip side coating enhances the conductivity of the tip and allows electrical contacts - the typical tip radius of curvature is less than 50nm. The detector side coating enhances the reflectivity of the laser beam by a factor of 2.5 and prevents light from interfering within the cantilever. The coating process is optimized for stress compensation. The bending of the cantilever due to stress is less than 3.5% of the cantilever length.

Probes Datasheets:

Datasheet for all AFM probes with sets of 10 or 20 probes

Your free samples request

PPP-NCLAu Specification Sheet