AFM Tip S-MFMR

S-MFMR datasheet

manufacturer:

www.nanoworld.com

View this AFM Tip
on manufacturer's website

AFM Probe Type: S-MFMR

Product Description:

NanoWorld Pointprobe® S-MFMR AFM probes are designed for the measurement of magnetic domains in soft magnetic samples. Due to the low coercivity of the soft magnetic tip coating the magnetisation of the tip will easily get reoriented by hard magnetic samples.

All probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. The tip is shaped like a polygon based pyramid.

Additionally this sensor offers unique features:

        - soft magnetic coating on the tip side (coercivity of app. 0.75 Oe, remanence magnetization of
        app. 225 emu/cm3)
        - effective magnetic moment 0.75x of standard probes
        - excellent tip radius of curvature
        - magnetic resolution better than 35 nm

Application Modes:

Magnetic Force AFM Probes (MFM)

AFM Probe Specifications:

AFM Cantilevers:

Shape	Length	Width	Thickness	Force Const.	Res. Freq.
beam	225 µm(220 - 230 µm)*	28 µm(22.5 - 32.5 µm)*	3 µm(2.5 - 3.5 µm)*	2.8 N/m(1.2 - 5.5 N/m)*	75 kHz(60 - 90 kHz)*

AFM Tips:

Shape	Tip Height	Tip Radius
Standard	10 - 15 µm*	<30 nm guaranteed

* typical range

Coating:

The reflex coating on the detector side of the cantilever enhances its reflectivity and prevents light from interfering within the cantilever.

Purchasing Info:

Product Availability:	From stock
Price Description:	Does not include VAT or customs duties. Include shipping within the EU for orders with an order value of more than 500,- €.