NanoWorld Pointprobe® S-MFMR AFM probes are designed for the measurement of magnetic domains in soft magnetic samples. Due to the low coercivity of the soft magnetic tip coating the magnetisation of the tip will easily get reoriented by hard magnetic samples.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. The tip is shaped like a polygon based pyramid with a height of 10-15 µm.
Additionally this sensor offers unique features:
· soft magnetic coating on the tip side (coercivity of app. 0.75 Oe, remanence magnetization of app. 225 emu/cm3)
· effective magnetic moment 0.75x of standard probes
· tip radius of curvature of the coated tip < 30 nm
· magnetic resolution better than 35 nm
The reflex coating on the detector side of the cantilever enhances its reflectivity and prevents light from interfering within the cantilever.
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| beam | 225 µm (220 - 230 µm)* | 28 µm (22.5 - 32.5 µm)* | 3 µm (2.5 - 3.5 µm)* | 2.8 N/m (1.2 - 5.5 N/m)* | 75 kHz (60 - 90 kHz)* | ||
| cant. | shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|---|
| Standard | 0 µm (10 - 15 µm)* | 10 - 15 µm* | 0 µm (0 - 0 µm)* | < 30 nm guaranteed |
* typical range
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