PPP-CONT
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Standard Contact Mode AFM Probe
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- Coating:
None
- Tip Shape:
Standard
- Cantilever:
Length: 450 µm
Force const.: 0.2 N/m
Res. freq.: 13 kHz
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PPP-CONTR
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Standard Contact Mode AFM Probe
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- Coating:
Reflex Aluminium
- Tip Shape:
Standard
- Cantilever:
Length: 450 µm
Force const.: 0.2 N/m
Res. freq.: 13 kHz
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ARROW-CONTR
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Contact Mode AFM Probe with Tip at the Very End of the Cantilever |
- Coating:
Reflex Aluminium
- Tip Shape:
Arrow
- Cantilever:
Length: 450 µm
Force const.: 0.2 N/m
Res. freq.: 14 kHz
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ARROW-CONT
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Contact Mode AFM Probe with Tip at the Very End of the Cantilever
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- Coating:
None
- Tip Shape:
Arrow
- Cantilever:
Length: 450 µm
Force const.: 0.2 N/m
Res. freq.: 14 kHz
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CONT
|
Standard Contact Mode AFM Probe
|
- Coating:
None
- Tip Shape:
Standard
- Cantilever:
Length: 450 µm
Force const.: 0.2 N/m
Res. freq.: 13 kHz
|
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ESP
|
Standard Contact Mode AFM Probe
|
- Coating:
Reflex Aluminium
- Tip Shape:
Standard
- Cantilever:
Length: 450 µm
Force const.: 0.2 N/m
Res. freq.: 13 kHz
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CONTR
|
Standard Contact Mode AFM Probe
|
- Coating:
Reflex Aluminium
- Tip Shape:
Standard
- Cantilever:
Length: 450 µm
Force const.: 0.2 N/m
Res. freq.: 13 kHz
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CONTSC
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Contact Mode AFM Probe with Short Cantilever
|
- Coating:
None
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 0.2 N/m
Res. freq.: 23 kHz
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CONTSCR
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Contact Mode AFM Probe with Short Cantilever
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- Coating:
Reflex Aluminium
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 0.2 N/m
Res. freq.: 23 kHz
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ATEC-CONT
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Contact Mode AFM Probe with REAL Tip Visibility
|
- Coating:
None
- Tip Shape:
Visible
- Cantilever:
Length: 450 µm
Force const.: 0.2 N/m
Res. freq.: 15 kHz
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Contact
|
Standard Contact Mode AFM Probe
|
- Coating:
None
- Tip Shape:
Rotated
- Cantilever:
Length: 450 µm
Force const.: 0.2 N/m
Res. freq.: 13 kHz
|
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ContAl
|
Standard Contact Mode AFM Probe
|
- Coating:
Reflex Aluminium
- Tip Shape:
Rotated
- Cantilever:
Length: 450 µm
Force const.: 0.2 N/m
Res. freq.: 13 kHz
|
|
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ContAl-G
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Standard Contact Mode AFM Probe
|
- Coating:
Reflex Aluminium
- Tip Shape:
Rotated
- Cantilever:
Length: 450 µm
Force const.: 0.2 N/m
Res. freq.: 13 kHz
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All-In-One
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AFM probe with 4 different cantilevers for various applications
|
- Coating:
None
- Tip Shape:
Rotated
- Cantilevers:
Cantilever 1:
Length: 100 µm
Force const.: 40 N/m
Res. freq.: 350 kHz
Cantilever 2:
Length: 150 µm
Force const.: 7.4 N/m
Res. freq.: 150 kHz
Cantilever 3:
Length: 210 µm
Force const.: 2.7 N/m
Res. freq.: 80 kHz
Cantilever 4:
Length: 500 µm
Force const.: 0.2 N/m
Res. freq.: 15 kHz
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All-In-One-Al
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AFM probe with 4 different cantilevers for various applications
|
- Coating:
Reflex Aluminium
- Tip Shape:
Rotated
- Cantilevers:
Cantilever 1:
Length: 0
Force const.: 0
Res. freq.: 0
Cantilever 2:
Length: 100 µm
Force const.: 40 N/m
Res. freq.: 350 kHz
Cantilever 3:
Length: 150 µm
Force const.: 7.4 N/m
Res. freq.: 150 kHz
Cantilever 4:
Length: 210 µm
Force const.: 2.7 N/m
Res. freq.: 80 kHz
Cantilever 5:
Length: 500 µm
Force const.: 0.2 N/m
Res. freq.: 15 kHz
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SiNi
|
Silicon Nitride AFM Probe
|
- Coating:
Reflex Aluminium
- Tip Shape:
Pyramid
- Cantilevers:
Cantilever 1:
Length: 100 µm
Force const.: 0.27 N/m
Res. freq.: 30 kHz
Cantilever 2:
Length: 200 µm
Force const.: 0.06 N/m
Res. freq.: 10 kHz
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PNP-TR
|
Silicon Nitride AFM Probe
|
- Coating:
Reflex Chromium/Gold
- Tip Shape:
Pyramid
- Cantilevers:
Cantilever 1:
Length: 100 µm
Force const.: 0.32 N/m
Res. freq.: 67 kHz
Cantilever 2:
Length: 200 µm
Force const.: 0.08 N/m
Res. freq.: 17 kHz
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PNP-DB
|
Silicon Nitride AFM Probe
|
- Coating:
Reflex Chromium/Gold
- Tip Shape:
Pyramid
- Cantilevers:
Cantilever 1:
Length: 100 µm
Force const.: 0.48 N/m
Res. freq.: 67 kHz
Cantilever 2:
Length: 200 µm
Force const.: 0.06 N/m
Res. freq.: 17 kHz
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PPP-CONTSC
|
Contact Mode AFM Probe with Short Cantilever
|
- Coating:
None
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 0.2 N/m
Res. freq.: 23 kHz
|
|
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PPP-CONTSCR
|
Contact Mode AFM Probe with Short Cantilever
|
- Coating:
Reflex Aluminium
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 0.2 N/m
Res. freq.: 23 kHz
|
|
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PPP-CONTAuD
|
Gold Coated Contact Mode AFM Probe
|
- Coating:
Reflex Gold
- Tip Shape:
Standard
- Cantilever:
Length: 450 µm
Force const.: 0.2 N/m
Res. freq.: 13 kHz
|
|
ContGD
|
Gold Coated Contact Mode AFM Probe
|
- Coating:
Reflex Gold
- Tip Shape:
Rotated
- Cantilever:
Length: 450 µm
Force const.: 0.2 N/m
Res. freq.: 13 kHz
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BudgetComboBox
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Mixed Box with 50 BudgetSensors AFM probes of your choice
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PPP-XYCONTR
|
Contact Mode AFM Probe with Special Alignment System
|
- Coating:
Reflex Aluminium
- Tip Shape:
Standard
- Cantilever:
Length: 450 µm
Force const.: 0.2 N/m
Res. freq.: 13 kHz
|
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PPP-RT-CONTR
|
Standard Contact Mode AFM Probe
|
- Coating:
Reflex Aluminium
- Tip Shape:
Rotated
- Cantilever:
Length: 450 µm
Force const.: 0.2 N/m
Res. freq.: 13 kHz
|
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CP-CONT-Au
|
Colloidal probe, AFM cantilever with round tip like a ball.
|
- Coating:
Gold
- Tip Shape:
Sphere
- Cantilever:
Length: 450 µm
Force const.: 0.2 N/m
Res. freq.: 13 kHz
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CP-CONT-BSG
|
Colloidal probe, AFM cantilever with round tip like a ball.
|
- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
Length: 450 µm
Force const.: 0.2 N/m
Res. freq.: 13 kHz
|
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CP-CONT-PM
|
Colloidal probe, AFM cantilever with round tip like a ball.
|
- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
Length: 450 µm
Force const.: 0.2 N/m
Res. freq.: 13 kHz
|
|
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CP-CONT-PS
|
Colloidal probe, AFM cantilever with round tip like a ball.
|
- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
Length: 450 µm
Force const.: 0.2 N/m
Res. freq.: 13 kHz
|
|
|
CP-CONT-SiO
|
Colloidal probe, AFM cantilever with round tip like a ball.
|
- Coating:
None
- Tip Shape:
Sphere
- Cantilever:
Length: 450 µm
Force const.: 0.2 N/m
Res. freq.: 13 kHz
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CP-PNP-Au
|
Colloidal probe, AFM cantilever with round tip like a ball.
|
- Coating:
Gold
- Tip Shape:
Sphere
- Cantilevers:
Cantilever 1:
Length: 100 µm
Force const.: 0.32 N/m
Res. freq.: 67 kHz
Cantilever 2:
Length: 200 µm
Force const.: 0.08 N/m
Res. freq.: 17 kHz
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|
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CP-PNP-BSG
|
Colloidal probe, AFM cantilever with round tip like a ball.
|
- Coating:
Reflex Chromium/Gold
- Tip Shape:
Sphere
- Cantilevers:
Cantilever 1:
Length: 100 µm
Force const.: 0.32 N/m
Res. freq.: 67 kHz
Cantilever 2:
Length: 200 µm
Force const.: 0.08 N/m
Res. freq.: 17 kHz
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|
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CP-PNP-PM
|
Colloidal probe, AFM cantilever with round tip like a ball.
|
- Coating:
Reflex Chromium/Gold
- Tip Shape:
Sphere
- Cantilevers:
Cantilever 1:
Length: 100 µm
Force const.: 0.32 N/m
Res. freq.: 67 kHz
Cantilever 2:
Length: 200 µm
Force const.: 0.08 N/m
Res. freq.: 17 kHz
|
|
|
CP-PNP-PS
|
Colloidal probe, AFM cantilever with round tip like a ball.
|
- Coating:
Reflex Chromium/Gold
- Tip Shape:
Sphere
- Cantilevers:
Cantilever 1:
Length: 100 µm
Force const.: 0.32 N/m
Res. freq.: 67 kHz
Cantilever 2:
Length: 200 µm
Force const.: 0.08 N/m
Res. freq.: 17 kHz
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|
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CP-PNP-SiO
|
Colloidal probe, AFM cantilever with round tip like a ball.
|
- Coating:
Reflex Chromium/Gold
- Tip Shape:
Sphere
- Cantilevers:
Cantilever 1:
Length: 100 µm
Force const.: 0.32 N/m
Res. freq.: 67 kHz
Cantilever 2:
Length: 200 µm
Force const.: 0.08 N/m
Res. freq.: 17 kHz
|
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AFM Probes
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