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Lateral Force Mode AFM Probes (LFM)
AFM probes
Lateral Force Mode AFM Probes (LFM)
Call us:
+ 49 (0) 6441 870 6272
Wetzlar, Germany
+ 49 (0) 6 441 870 6 272
+ 49 (0) 6 441 870 6 274
info@nanoandmore.com
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--manufacturer--
NANOSENSORS
BudgetSensors
NanoWorld
NanoTools
sQube
Team Nanotec
SmartTip
KELVIN Nanotechnology
--coating--
Reflex Aluminum
Gold Overall
Electrically Conductive
Magnetic
Reflex Chromium/Gold
Conductive Diamond
Diamond
Antistatic Aluminium Coating
Reflex Titanium/Gold
None
Hard Diamond-Like-Carbon
--tip shape--
Rotated
High-Aspect-Ratio
Arrow
Tipless
Visible
Standard
Functionalized
Cone Shaped
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Plateau
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new only
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description
specs:
PPP-LFMR
Standard Lateral Force Mode AFM Probes
Coating:
Reflex Aluminium
Tip Shape:
Standard
Cantilever:
Length: 225 µm
Force const.: 0.2 N/m
Res. freq.: 23 kHz
PPP-CONTSCR
Contact Mode AFM Probe with Short Cantilever
Coating:
Reflex Aluminium
Tip Shape:
Standard
Cantilever:
Length: 225 µm
Force const.: 0.2 N/m
Res. freq.: 23 kHz
PPP-CONTSC
Contact Mode AFM Probe with Short Cantilever
Coating:
None
Tip Shape:
Standard
Cantilever:
Length: 225 µm
Force const.: 0.2 N/m
Res. freq.: 23 kHz
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