Product Description:

Rotated, monolithic silicon AFM probe for Magnetic Force Microscopy;
Symmetric tip shape;
The AFM holder chip fits most commercial AFMs as it is industry standard size. It is compatible with DI/Veeco AFMs, TM Microscopes, JEOL, Molecular Imaging, and other commercial atomic force microscopes (AFMs). Chipsize: 3.4 x 1.6 x 0.3 mm

Consistent high quality at a lower price!

This product features alignment grooves on the backside of the holder chip.

Application Modes:

• Magnetic Force Microscopy AFM Probes (MFM)
• Force Modulation Mode AFM Probes (FM)

AFM Probe Specifications:

  AFM Cantilevers:

Cant.	Length	Width	Thickness	Force Const.	Res. Freq.
1	225 µm(215 - 235 µm)*	28 µm(23 - 33 µm)*	3 µm(2 - 4 µm)*	3 N/m(1 - 7 N/m)*	75 kHz(60 - 90 kHz)*

  AFM Tips:

on Cant.	Shape	Tip Height	Tip Set Back	Tip Radius	Half Cone Angles
1	Rotated	17 µm(15 - 19 µm)*	15 nm(10 - 20 nm)*	<60 nm	20°-25° along cantilever axis 25°-30° from side 10° at the apex

Coating:

Hard magnetic, medium momentum coating on tip side of the cantilever
and aluminium reflex coating on detector side of the cantilever

Sensors Datasheets:

No datasheet