Product Description:

For lateral or friction force microscopy NANOSENSORS™ offers a special type of AFM probe (LFM: lateral force microscopy). This sensor type is optimized for a high sensitivity to lateral or friction forces by an extremely soft, thin cantilever.

 
    The probe offers unique features:
        - excellent tip radius of curvature
        - highly doped to dissipate static charge
        - Al coating on detector side of cantilever
        - high mechanical Q-factor for high sensitivity
        - precise alignment of the cantilever position (within +/- 2 µm) in conjunction with the usage
          of the alignment chip
        - compatible with PointProbe® Plus XY-Alignment Series

This product features alignment grooves on the backside of the holder chip.

Application Modes:

• Lateral Force Microscopy AFM Probes (LFM)

AFM Probe Specifications:

  AFM Cantilevers:

Cant.	Length	Width	Thickness	Force Const.	Res. Freq.
1	225 µm(215 - 235 µm)*	48 µm(40 - 55 µm)*	1 µm(0.1 - 2 µm)*	0.2 N/m(0.01 - 1.87 N/m)*	23 kHz(1 - 57 kHz)*

  AFM Tips:

on Cant.	Shape	Tip Radius
1	Standard	<7 nm( < 10 nm guaranteed )

* - guaranteed range

Coating:

The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2% of the cantilever length.

Sensors Datasheets:

Datasheet for all AFM probes with sets of 10 or 20 probes.
Datasheet for up to 32 probes with full wafer.