Rotated, monolithic silicon AFM probe with symmetric tip shape, for contact mode and electric modes like:
- Scanning Capacitance Microscopy (SCM),
- Electrostatic Force Microscopy (EFM),
- Kelvin probe Force Microscopy (KFM),
- Scanning probe lithography;
Consistent high quality at a lower price!
Premounted AFM probe on a Quesant T-plate for Quesant AFM systems. Based on a BudgetSensors ElectriCont AFM probe.
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| beam | 450 µm (440 - 460 µm)* | 50 µm (45 - 55 µm)* | 2 µm (1 - 3 µm)* | 0.2 N/m (0.07 - 0.4 N/m)* | 13 kHz (9 - 17 kHz)* | ||
| cant. | shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|---|
| Rotated | 17 µm (15 - 19 µm)* | 15 - 19 µm* | 15 µm (10 - 20 µm)* | < 25 nm |
20°-25° along cantilever axis 25°-30° from side 10° at the apex |
* typical range
Available on demand. Please contact us for availability!
No taxes applied except 6% in South Carolina.
Does not include shipment costs.