Product Description:

Rotated, monolithic silicon AFM probe with symmetric tip shape, for contact mode and electric modes like:
- Scanning Capacitance Microscopy (SCM),
- Electrostatic Force Microscopy (EFM),
- Kelvin probe Force Microscopy (KFM),
- Scanning probe lithography;

The AFM holder chip fits most commercial AFMs as it is industry standard size. It is compatible with DI/Veeco AFMs, TM Microscopes, JEOL, Molecular Imaging, and other commercial atomic force microscopes (AFMs). Chipsize: 3.4 x 1.6 x 0.3 mm

Consistent high quality at a lower price!


Premounted AFM probe on a Quesant T-plate for Quesant AFM systems. Based on a BudgetSensors ElectriCont AFM probe.

Application Modes:

• Premounted AFM Probes

AFM Probe Specifications:

  AFM Cantilevers:

Cant.	Length	Width	Thickness	Force Const.	Res. Freq.
1	450 µm(440 - 460 µm)*	50 µm(45 - 55 µm)*	2 µm(1 - 3 µm)*	0.2 N/m(0.07 - 0.4 N/m)*	13 kHz(9 - 17 kHz)*

  AFM Tips:

on Cant.	Shape	Tip Height	Tip Set Back	Tip Radius	Half Cone Angles
1	Rotated	17 µm(15 - 19 µm)*	15 nm(10 - 20 nm)*	<25 nm	20°-25° along cantilever axis 25°-30° from side 10° at the apex

Coating:

Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.

Sensors Datasheets:

No datasheet