PtSi-NCH
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Electrical, Tapping Mode AFM Probes
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- Coating:
Platinum/Silicide
- Tip Shape:
Standard
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 330 kHz
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PtSi-FM
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Electrical, Force Modulation AFM Probes
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- Coating:
Platinum/Silicide
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
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ARROW-NCPt
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Electrical, Tapping Mode AFM Probe with Tip at the Very End of the Cantilever
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- Coating:
Electrically Conductive
- Tip Shape:
Arrow
- Cantilever:
Length: 160 µm
Force const.: 42 N/m
Res. freq.: 285 kHz
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ARROW-EFM
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Electrical, Force Modulation AFM Probe with Tip at the Very End of the Cantilever
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- Coating:
Electrically Conductive
- Tip Shape:
Arrow
- Cantilever:
Length: 240 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
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ARROW-CONTPt
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Electrical, Contact Mode AFM Probe with Tip at the Very End of the Cantilever
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- Coating:
Electrically Conductive
- Tip Shape:
Arrow
- Cantilever:
Length: 450 µm
Force const.: 0.2 N/m
Res. freq.: 14 kHz
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ATEC-EFM
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Electrical, Force Modulation AFM Probe with REAL Tip Visibility
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- Coating:
Electrically Conductive
- Tip Shape:
Visible
- Cantilever:
Length: 240 µm
Force const.: 2.8 N/m
Res. freq.: 85 kHz
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ATEC-CONTPt
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Electrical, Contact Mode AFM Probe with REAL Tip Visibility
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- Coating:
Electrically Conductive
- Tip Shape:
Visible
- Cantilever:
Length: 450 µm
Force const.: 0.2 N/m
Res. freq.: 15 kHz
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NCHPt
|
Electrical, Tapping Mode AFM Probe
|
- Coating:
Electrically Conductive
- Tip Shape:
Standard
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 320 kHz
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SCM-PIT
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Electrical, Force Modulation AFM Probe
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- Coating:
Electrically Conductive
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
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SCM-PIC
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Electrical, Contact Mode AFM Probe
|
- Coating:
Electrically Conductive
- Tip Shape:
Standard
- Cantilever:
Length: 450 µm
Force const.: 0.2 N/m
Res. freq.: 13 kHz
|
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Tap300GB
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Gold Coated Tapping Mode AFM Probe
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- Coating:
Gold Overall
- Tip Shape:
Rotated
- Cantilever:
Length: 125 µm
Force const.: 40 N/m
Res. freq.: 300 kHz
|
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Multi75GB-G
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Gold Coated Force Modulation AFM Probe
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- Coating:
Gold Overall
- Tip Shape:
Rotated
- Cantilever:
Length: 225 µm
Force const.: 3 N/m
Res. freq.: 75 kHz
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ATEC-NCAu
|
Gold Coated Tapping Mode AFM Probe with REAL Tip Visibility
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- Coating:
Gold Overall
- Tip Shape:
Visible
- Cantilever:
Length: 160 µm
Force const.: 45 N/m
Res. freq.: 335 kHz
|
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ATEC-FMAu
|
Gold Coated Force Modulation AFM Probe with REAL Tip Visibility
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- Coating:
Chromium/Gold
- Tip Shape:
Visible
- Cantilever:
Length: 240 µm
Force const.: 2.8 N/m
Res. freq.: 85 kHz
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ATEC-CONTAu
|
Gold Coated Contact Mode AFM Probe with REAL Tip Visibility
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- Coating:
Chromium/Gold
- Tip Shape:
Visible
- Cantilever:
Length: 450 µm
Force const.: 0.2 N/m
Res. freq.: 15 kHz
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PPP-CONTSCPt
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Electrical, Contact Mode AFM Probe with Short Cantilever
|
- Coating:
Electrically Conductive
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 0.2 N/m
Res. freq.: 23 kHz
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ContGB-G
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Gold Coated Contact Mode AFM Probe
|
- Coating:
Gold Overall
- Tip Shape:
Rotated
- Cantilever:
Length: 450 µm
Force const.: 0.2 N/m
Res. freq.: 13 kHz
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ElectriCont-G
|
Electrical, Contact Mode AFM Probe
|
- Coating:
Chromium/Platinum
- Tip Shape:
Rotated
- Cantilever:
Length: 450 µm
Force const.: 0.2 N/m
Res. freq.: 13 kHz
|
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ElectriMulti75-G
|
Electrical, Force Modulation AFM Probe
|
- Coating:
Chromium/Platinum
- Tip Shape:
Rotated
- Cantilever:
Length: 225 µm
Force const.: 3 N/m
Res. freq.: 75 kHz
|
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ElectriTap190-G
|
Electrical, Tapping Mode AFM Probe with a Long Cantilever
|
- Coating:
Chromium/Platinum
- Tip Shape:
Rotated
- Cantilever:
Length: 225 µm
Force const.: 48 N/m
Res. freq.: 190 kHz
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ElectriTap300
|
Electrical, Tapping Mode AFM Probe
|
- Coating:
Chromium/Platinum
- Tip Shape:
Rotated
- Cantilever:
Length: 125 µm
Force const.: 40 N/m
Res. freq.: 300 kHz
|
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EFM
|
Electrical, Force Modulation AFM Probe
|
- Coating:
Electrically Conductive
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
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CONTPt
|
Electrical, Contact Mode AFM Probe
|
- Coating:
Electrically Conductive
- Tip Shape:
Standard
- Cantilever:
Length: 450 µm
Force const.: 0.2 N/m
Res. freq.: 13 kHz
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PPP-NCHPt
|
Electrical, Tapping Mode AFM Probe
|
- Coating:
Electrically Conductive
- Tip Shape:
Standard
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 330 kHz
|
|
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ElectriMulti75
|
Electrical, Force Modulation AFM Probe
|
- Coating:
Chromium/Platinum
- Tip Shape:
Rotated
- Cantilever:
Length: 225 µm
Force const.: 3 N/m
Res. freq.: 75 kHz
|
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CDT-CONTR
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Diamond Coated, Conductive Contact Mode AFM Probe
|
- Coating:
Conductive Diamond
- Tip Shape:
Standard
- Cantilever:
Length: 450 µm
Force const.: 0.5 N/m
Res. freq.: 20 kHz
|
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CDT-NCHR
|
Diamond Coated, Conductive Tapping Mode AFM Probe
|
- Coating:
Conductive Diamond
- Tip Shape:
Standard
- Cantilever:
Length: 125 µm
Force const.: 80 N/m
Res. freq.: 400 kHz
|
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CDT-NCLR
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Diamond Coated, Conductive Tapping Mode AFM Probe with Long Cantilever
|
- Coating:
Conductive Diamond
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 72 N/m
Res. freq.: 210 kHz
|
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CDTP-NCHR
|
Diamond Coated, Conductive Tapping Mode AFM Probe
|
- Coating:
Conductive Diamond
- Tip Shape:
Standard
- Cantilever:
Length: 125 µm
Force const.: 120 N/m
Res. freq.: 480 kHz
|
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PPP-CONTPt
|
Electrical, Contact Mode AFM Probe
|
- Coating:
Electrically Conductive
- Tip Shape:
Standard
- Cantilever:
Length: 450 µm
Force const.: 0.2 N/m
Res. freq.: 13 kHz
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PPP-CONTSCAu
|
Gold Coated Contact Mode AFM Probe with Short Cantilever
|
- Coating:
Gold Overall
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 0.2 N/m
Res. freq.: 23 kHz
|
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ATEC-NCPt
|
Electrical, Tapping Mode AFM Probe with REAL Tip Visibility
|
- Coating:
Electrically Conductive
- Tip Shape:
Visible
- Cantilever:
Length: 160 µm
Force const.: 45 N/m
Res. freq.: 335 kHz
|
|
NW-CDT-NCLR
|
Diamond Coated, Conductive Tapping Mode AFM Probe with Long Cantilever
|
- Coating:
Conductive Diamond
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 72 N/m
Res. freq.: 210 kHz
|
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NW-CDT-NCHR
|
Diamond Coated, Conductive Tapping Mode AFM Probe
|
- Coating:
Conductive Diamond
- Tip Shape:
Standard
- Cantilever:
Length: 125 µm
Force const.: 80 N/m
Res. freq.: 400 kHz
|
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NW-CDT-FMR
|
Diamond Coated, Conductive Force Modulation AFM Probe
|
- Coating:
Conductive Diamond
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 6.2 N/m
Res. freq.: 105 kHz
|
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DDESP-FM
|
Diamond Coated, Conductive Force Modulation AFM Probe
|
- Coating:
Conductive Diamond
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
|
|
|
DDESP
|
Diamond Coated, Conductive Tapping Mode AFM Probe
|
- Coating:
Conductive Diamond
- Tip Shape:
Standard
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 320 kHz
|
|
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PPP-NCSTPt
|
Electrical, Soft Tapping Mode AFM Probe
|
- Coating:
Electrically Conductive
- Tip Shape:
Standard
- Cantilever:
Length: 150 µm
Force const.: 7.4 N/m
Res. freq.: 160 kHz
|
|
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PPP-NCSTAu
|
Gold Coated Soft Tapping Mode AFM Probe
|
- Coating:
Gold Overall
- Tip Shape:
Standard
- Cantilever:
Length: 150 µm
Force const.: 7.4 N/m
Res. freq.: 160 kHz
|
|
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PPP-NCLPt
|
Electrical, Tapping Mode AFM Probe with a Long Cantilever
|
- Coating:
Electrically Conductive
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 48 N/m
Res. freq.: 190 kHz
|
|
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PPP-NCLAu
|
Gold Coated Tapping Mode AFM Probe with Long Cantilever
|
- Coating:
Gold Overall
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 48 N/m
Res. freq.: 190 kHz
|
|
|
PPP-NCHAu
|
Gold Coated Tapping Mode AFM Probe
|
- Coating:
Gold Overall
- Tip Shape:
Standard
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 330 kHz
|
|
|
PPP-FMAu
|
Gold Coated Force Modulation AFM Probe
|
- Coating:
Gold Overall
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
|
|
|
PPP-EFM
|
Electrical, Force Modulation AFM Probe
|
- Coating:
Electrically Conductive
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
|
|
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PPP-CONTAu
|
Gold Coated Contact Mode AFM Probe
|
- Coating:
Gold Overall
- Tip Shape:
Standard
- Cantilever:
Length: 450 µm
Force const.: 0.2 N/m
Res. freq.: 13 kHz
|
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