Magnetic Force Microscopy AFM Probes (MFM)
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PPP-MFMR
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Hard Magnetic, Medium Momentum AFM Probe
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- Coating:
Hard Magnetic, Medium Momentum
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
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MFMR
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Hard Magnetic, Medium Momentum AFM Probe
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- Coating:
Hard Magnetic
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
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Multi75M-G
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Hard Magnetic, Medium Momentum AFM Probe
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- Coating:
Hard Magnetic, Medium Momentum
- Tip Shape:
Rotated
- Cantilever:
Length: 225 µm
Force const.: 3 N/m
Res. freq.: 75 kHz
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PPP-LM-MFMR
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Hard Magnetic, Low Momentum AFM Probe
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- Coating:
Hard Magnetic, Low Momentum
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
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PPP-LC-MFMR
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Soft Magnetic, Medium Momentum AFM Probe
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- Coating:
Soft Magnetic, Medium Momentum
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
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PPP-QLC-MFMR
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Soft Magnetic, Medium Momentum AFM Probe with a High Mechanical Q-Factor
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- Coating:
Soft Magnetic, Medium Momentum
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
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S-MFMR
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Soft Magnetic, Medium Momentum AFM Probe
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- Coating:
Soft Magnetic, Medium Momentum
- Tip Shape:
Standard
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
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SSS-MFMR
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SuperSharp, Hard Magnetic, Low Momentum AFM Probe
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- Coating:
Hard Magnetic, Low Momentum
- Tip Shape:
Supersharp
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
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SSS-QMFMR
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SuperSharp, Hard Magnetic, Low Momentum AFM Probe with a High Mechanical Q-Factor
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- Coating:
Hard Magnetic
- Tip Shape:
Supersharp
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
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AFM Probes
