AFM Probe Info » AFM Support Chips Classification

AFM Support Chips by Size

AFM Support Chips by Thickness

AFM Support Chips by Material

AFM Support Chips by Alignment Grooves

AFM Support Chip with Alignment Grooves (backside view)
AFM Support Chip with
Alignment Grooves
(Backside View)
AFM Support Chips with Alignment Grooves

In combination with the Alignment Chip (ALIGN), probes with Alignment Grooves allow repositioning of tips with an accuracy of better than ± 2µm for the same probe type.

» Browse all AFM probes with AFM support chips with standard aligment grooves

 

NW-DT-NCLR

NW-DT-NCLR

Diamond Coated Tapping Mode AFM Probe with Long Cantilever
Coating: Diamond
Tip shape: Standard
Cantilever:
F 210 kHz
C 72 N/m
L 225 µm
AFM Support Chips with XY Alignment Grooves

The XY-auto-alignment probes extend the plug-and-fit alignment concept of the Alignment Chip (ALIGN) to probes with different cantilever lengths. Probe exchange with a tip repositioning accuracy of better than ± 8 µm is possible for all probes of the XY-alignment probes series - independent of their cantilever length. This series is adjusted to the tip position of probes with a cantilever length of 225 µm.

» Browse all AFM probes with AFM support chips with XY aligment grooves

PPP-XYNCHR

PPP-XYNCHR

Tapping Mode AFM Probe with Special Alignment System
Coating: Reflex Aluminum
Tip shape: Standard
Cantilever:
F 330 kHz
C 42 N/m
L 125 µm