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AFM Probes: AFM Tips: AFM Cantilevers
AFM probes
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Valid until: 31.05.2013
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+ 49 (0) 6441 870 6272
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+ 49 (0) 6 441 870 6 272
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AFM Probes
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AFM Probe focus:
PPP-NCHR
Standard Tapping Mode AFM Probe
Coating:
Reflex Aluminum
Tip shape:
Standard
Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 330 kHz
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Non-Contact / Tapping Mode AFM Probes
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Magnetic Force AFM Probes (MFM)
Enhanced Resolution AFM Tips (Supersharp)
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Trench Measurement / High Aspect Ratio AFM Tips
Nanoindentation AFM Probes
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Tipless AFM Cantilevers
AFM Cantilever Arrays
Functionalized Modified Chemical AFM Tips
Lithography AFM Probes
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Life Science AFM Probes
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Plateau AFM Tips
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Scanning Thermal Microscopy
Premounted AFM Probes
Platinum Silicide AFM Probes
We apply a quality management system in accordance with DIN EN ISO 9001:2008 (Certificate No.: 08301/2)