Happy Swiss National Holiday with Smallest Swiss CrossWed Jul 31 2019
Happy Swiss National Holiday with Smallest Swiss Cross on NANOSENSORS™ Blog Basel University: Smallest Swiss Cross - Made of 20 Single Atoms ( a NANOSENSORS™ PPP-NCL was used for this image) 20 bromine atoms positioned on a sodium chloride surface using the tip of an atomic force microscope at room temperature, creating a Swiss cross with the size of 5.6nm. The structure is stable at room temperature and was achieved by exchanging chlorine with bromine atoms. (Fig: University of Basel, Department of Physics)
Ultra-high resolution imaging of thin films and single strands of polythiophene using atomic force microscopyMon Jul 29 2019
Ultra-high resolution imaging of thin films and single strands of polythiophene using atomic force microscopy (https://www.nanoworld.com/blog/ultra-high-resolution-imaging-of-thin-films-and-single-strands-of-polythiophene-using-atomic-force-microscopy/?utm_source=Facebook&utm_medium=Blog&utm_content=Ultra-high+resolution+imaging+of+thin+films+and+single+strands+of+polythiophene+using+atomic+force+microscopy&utm_campaign=NanoWorld+Blog) has been published on NanoWorld Blog. Real-space images of polymers with sub-molecular resolution could provide valuable insights into the relationship between morphology and functionality of polymer optoelectronic devices, but their acquisition is problematic due to perceived limitations in atomic force microscopy (AFM).* In the article “Ultra-high resolution imaging of thin films and single strands of polythiophene using atomic force microscopy” Vladimir V. Korolkov, Alex Summerfield, Alanna Murphy, David B. Amabilino, Kenji Watanabe, Takashi Taniguchi and Peter H. Beton show that individual thiophene units and the lattice of semicrystalline spin-coated films of polythiophenes (PTs) may be resolved using AFM under ambient conditions through the low-amplitude (≤ 1 nm) excitation of higher eigenmodes of a cantilever.* They authors demonstrate that the use of higher eigenmodes in tapping-mode ambient AFM can be successfully employed to characterize both individual polymer strands down to a single-atom level and also the ordering of a semi-crystalline polymer with technological relevance. The combination of AFM and solution deposition provides a simple and high-resolution approach to characterizing the structure of polymers.* The use of NanoWorld Arrow-UHF high frequency AFM probes at their first eigenmode of ~1.4 MHz is mentioned.* https://www.nanoworld.com/ultra-high-frequency-tapping-mode-afm-tip-arrow-uhf Please have a look at the NanoWorld blogpost for the full citation and a direct link to the full article. #AtomicForceMicroscopy #ImagingTechniques #MolecularSelfAssembly
BudgetSensors® HS or CS calibration grating!Mon Jul 22 2019
Get the most out of your BudgetSensors® HS or CS calibration grating! No surface is ideally smooth at the nanoscale, but that does not mean you cannot achieve highly accurate and precise calibration. Averaging the scan profile over several micrometers significantly improves your system's calibration. Check out our calibration gratings here: https://www.budgetsensors.com/calibration-standards
Ferroelectricity-free lead halide perovskites – NANOSENSORS™Sun Jul 21 2019
Ferroelectricity-free lead halide perovskites on NANOSENSORS Blog. In the recent publication “Ferroelectricity-free lead halide perovskites” Andrés Gómez, Qiong Wang, Alejandro R. Goñi, Mariano Campoy-Quilesa and Antonio Abate describe how they employed direct piezoelectric force microscopy ( DPFM ) to examine whether or not lead halide perovskites exhibit ferroelectricity.* Their article aims to provide a deeper understanding of the fundamental physical properties of the organic–inorganic lead halide perovskites and solves a longstanding dispute about their non-ferroelectric character: an issue of high relevance for optoelectronic and photovoltaic applications.* In the course of their research in which besides using DPFM, they also employed piezoelectric force microscopy ( PFM ) and electrostatic force microscopy ( EFM ), they could demonstrate the non-ferroelectricity of lead halide perovskites. * The PFM images were acquired using a PtIr coated NANOSENSORS PPP-EFM AFM probe. https://www.nanosensors.com/PointProbe-Plus-Electrostatic-Force-Microscopy-PtIr5-Coating-afm-tip-PPP-EFM Please have a look at the NANOSENORS blog for the full citation and a direct link to the full article. #perovskite #photovoltaics #ElectrostaticForceMicroscopy #AFMprobes
Highlights
AFM Probe Focus
best of the best
qp-HBC
uniqprobe™ - HeartBeat Cantilever for ScanAsyst®** and Peak Force Tapping™**
Coating:
Reflective Aluminum
Tip Shape: Circular symmetric
Tip Shape: Circular symmetric
AFM Cantilever:
F
60 kHz
C
0.5 N/m
L
115 µm
ATEC-NC
Tapping Mode AFM Probe with REAL Tip Visibility
Coating:
none
Tip Shape: Visible
Tip Shape: Visible
AFM Cantilever:
F
335 kHz
C
45 N/m
L
160 µm
TESPA
Standard Tapping Mode AFM Probe
Coating:
Reflective Aluminum
Tip Shape: Standard
Tip Shape: Standard
AFM Cantilever:
F
320 kHz
C
42 N/m
L
125 µm
OTESPA
Standard Tapping Mode AFM Probe with AFM Tip at the Very End of the AFM Cantilever
Coating:
Reflective Aluminum
Tip Shape: Optimized Positioning
Tip Shape: Optimized Positioning
AFM Cantilever:
F
300 kHz
C
26 N/m
L
160 µm
