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OMCL-AC55TS-B3 Box of 18 AFM Probes
1095.00 USD
OMCL-AC55TS-R3 Box of 100 AFM Probes
4250.00 USD
Your volume discount is 1833.33 USD or 30.10%
Price shown as ex-works and subjected to shipping charges, insurance, local VAT and custom duties respectively where applicable



Ultra High Frequency AFM Probe with AFM Tip at the Very End of the AFM Cantilever

Manufacturer: OLYMPUS

Coating: Reflective Gold
AFM tip shape: Optimized Positioning
AFM Cantilever
F 1600 kHz
C 85 N/m
L 55 µm
*nominal values
How to optimize AFM scan parameters gear icon

The OLYMPUS OMCL-AC55TS series silicon AFM probes feature an AFM tip with ‘TipView structure’ that makes it easy to estimate the position of the AFM tip relative to the sample measurement site. The sharpened, tetrahedral, point-terminated AFM tip has very good symmetry when viewed from the front and is inclined when viewed from the side.

The OLYMPUS OMCL-AC55TS AFM cantilever offers a high resonance frequency in the megahertz range and low thermal noise allowing high-speed, high-resolution measurements of liquid-solid interfaces, etc.

The back side of the AFM cantilever is coated with a thin gold reflective coating.

The parallel sidewalls of the holder chip make handling with tweezers easy and eliminate problems with chipping and debris. The holder chip does not feature alignment grooves.

A thin gold film with the thickness of 70 nm is deposited on the back side of the AFM cantilever for enhanced laser reflectivity.
AFM Tip:

  • AFM Cantilever:
  • 85 N/m (38 - 184 N/m)*
  • 1600 kHz (850 - 2500 kHz)*
  • 55 µm (45 - 65 µm)*
  • 31 µm (30 - 32 µm)*
  • 2.35 µm ( 2.05 - 2.65 µm)*
  • * typical range