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Order Code / Price*
OMCL-AC160TS-C3 Box of 24 AFM Probes
820.00 USD
OMCL-AC160TS-R3 Box of 100 AFM Probes
2395.00 USD
Your volume discount is 1021.67 USD or 29.90%
Price shown as ex-works and subjected to shipping charges, insurance, local VAT and custom duties respectively where applicable



Standard Tapping Mode AFM Probe with AFM Tip at the Very End of the AFM Cantilever

Manufacturer: OLYMPUS

Coating: Reflective Aluminum
AFM tip shape: Optimized Positioning
AFM Cantilever
F 300 kHz
C 26 N/m
L 160 µm
*nominal values
How to optimize AFM scan parameters gear icon

The OLYMPUS OMCL-AC160TS series silicon AFM probes feature an AFM tip with ‘TipView structure’ that makes it easy to estimate the position of the AFM tip relative to the sample measurement site. The sharpened, tetrahedral, point-terminated AFM tip has very good symmetry when viewed from the front and is inclined when viewed from the side.

The OLYMPUS OMCL-AC160TS offer a nominal force constant 26N/m while maintaining a high Q-factor value and a nominal resonance frequency of 300kHz. This minimizes damage to the sample and allows high-resolution sample surface roughness measurements and high-sensitivity phase measurements in air.

The AFM probes are made of silicon with low resistivity in the range 0.1-0.4Ω.cm. The back side of the AFM cantilever is coated with a thin aluminum reflective coating.

The parallel sidewalls of the holder chip make handling with tweezers easy and eliminate problems with chipping and debris. The holder chip does not feature alignment grooves.

A thin aluminum film with the thickness of 100nm is deposited on the back side of the AFM cantilever for enhanced laser reflectivity.
AFM Tip:

  • AFM Cantilever:
  • 26 N/m (8.4 - 57 N/m)*
  • 300 kHz (200 - 400 kHz)*
  • 160 µm (145 - 175 µm)*
  • 40 µm (38 - 42 µm)*
  • 3.7 µm ( 3.2 - 4.2 µm)*
  • * typical range