The OLYMPUS OMCL-AC160TS series silicon AFM probes feature an AFM tip with ‘TipView structure’ that makes it easy to estimate the position of the AFM tip relative to the sample measurement site. The sharpened, tetrahedral, point-terminated AFM tip has very good symmetry when viewed from the front and is inclined when viewed from the side.
The OLYMPUS OMCL-AC160TS offer a nominal force constant 26N/m while maintaining a high Q-factor value and a nominal resonance frequency of 300kHz. This minimizes damage to the sample and allows high-resolution sample surface roughness measurements and high-sensitivity phase measurements in air.
The AFM probes are made of silicon with low resistivity in the range 0.1-0.4Ω.cm. The back side of the AFM cantilever is coated with a thin aluminum reflective coating.
The parallel sidewalls of the holder chip make handling with tweezers easy and eliminate problems with chipping and debris. The holder chip does not feature alignment grooves.