Arrow-FM-Iridium™ - The Direct Replacement for the Discontinued ASYELEC.01 Conductive AFM Probe
| F | 75 kHz |
| C | 2.8 N/m |
| L | 240 µm |
Go to the Arrow FM Iridium™ product page. 
The proven probe platform trusted by ASYELEC.01 users - now available directly from NanoWorld®.
The NanoWorld® Arrow FM Iridium™ is a silicon-based beam deflection AFM probe specifically developed for nano-electrical measurements and designed as the direct one-to-one replacement for the discontinued ASYELEC.01 conductive AFM probe from Asylum Research, an Oxford Instruments company.
Built on NanoWorld's proven Arrow FM platform, Arrow FM Iridium continues the well-established probe geometry trusted by researchers worldwide for nano-electrical AFM applications. Combined with a durable iridium coating on both the AFM tip and detector side of the cantilever, it delivers outstanding electrical conductivity, excellent tip sharpness, long probe lifetime and the exceptional manufacturing quality for which NanoWorld® AFM probes are known.
Researchers currently using the ASYELEC.01 can seamlessly transition to Arrow FM Iridium while continuing to use their established imaging parameters, electrical measurement settings and experimental workflows. There is no need to redesign measurement protocols, optimize new operating conditions or qualify a different probe geometry. Arrow FM Iridium was developed to provide continuity for the AFM community and to ensure that this proven probe design remains available for future research.
Arrow FM Iridium is optimized for a broad range of nano-electrical AFM techniques including Conductive Atomic Force Microscopy (c-AFM), Electric Force Microscopy (EFM), Kelvin Probe Force Microscopy (KPFM), Scanning Capacitance Microscopy (SCM), Scanning Spreading Resistance Microscopy (SSRM) and other electrical scanning probe microscopy applications requiring high electrical conductivity together with excellent spatial resolution.
The unique Arrow™ cantilever geometry provides several important advantages over conventional rectangular cantilevers. A wide detector area enables fast and reliable laser alignment, while the narrow front section minimizes hydrodynamic damping. Because the AFM tip is positioned at the very end of the cantilever and remains clearly visible under the optical microscope, precise placement on small structures and devices becomes significantly easier. This distinctive Arrow™ design has become well established for demanding nano-electrical measurements where positioning accuracy is critical.
Like all NanoWorld® Arrow™ probes, Arrow FM Iridium is manufactured from highly doped monolithic silicon to efficiently dissipate electrostatic charge. The cantilever is chemically inert, exhibits a high mechanical Q-factor for excellent force sensitivity and features a tetrahedral silicon tip with an optimized iridium coating that combines high-resolution topographical imaging with outstanding electrical performance and excellent wear resistance.
The combination of NanoWorld's proven Arrow FM platform, robust iridium coating and consistently high manufacturing quality makes Arrow FM Iridium the natural successor for researchers looking to replace the discontinued ASYELEC.01 while preserving the performance and reliability of their established measurement workflows.
Is Arrow FM Iridium the replacement for ASYELEC.01?
Yes. Arrow FM Iridium was specifically developed as the direct one-to-one replacement for the discontinued ASYELEC.01 conductive AFM probe, allowing researchers to continue using the same proven probe geometry for their nano-electrical AFM measurements.
Can I continue using my existing imaging parameters?
Yes. Arrow FM Iridium preserves the proven Arrow FM cantilever geometry and mechanical characteristics, allowing users to continue working with their established measurement procedures and experimental protocols without changing to a different probe platform.
Which applications is Arrow FM Iridium intended for?
Arrow FM Iridium is optimized for Conductive AFM (c-AFM), Electric Force Microscopy (EFM), Kelvin Probe Force Microscopy (KPFM), Scanning Capacitance Microscopy (SCM), Scanning Spreading Resistance Microscopy (SSRM) and many other nano-electrical AFM techniques.
Why was Arrow FM Iridium developed?
Arrow FM Iridium was developed to ensure the continued availability of a proven conductive AFM probe design following the discontinuation of the ASYELEC.01. It enables researchers to continue using a familiar, well-established probe platform without compromising existing experimental workflows or measurement performance.
