The NanoWorld Arrow FM Iridium™ is a silicon-based beam deflection AFM probe with a Iridium coating on both Tip and detector side, specifically developed for nano-electrical measurements and designed as the direct one-to-one replacement for the discontinued ASYELEC.01 conductive AFM probe from Asylum Research, an Oxford Instruments company.
Built on NanoWorld's proven Arrow FM platform, Arrow FM Iridium continues the well-established probe geometry trusted by researchers worldwide for nano-electrical AFM applications. Combined with a durable iridium coating on both the AFM tip and detector side of the cantilever, it delivers outstanding electrical conductivity, excellent tip sharpness, long probe lifetime and the exceptional manufacturing quality for which NanoWorld AFM probes are known.
Arrow FM Iridium is optimized for a broad range of nano-electrical AFM techniques including Conductive Atomic Force Microscopy (c-AFM), Electric Force Microscopy (EFM), Kelvin Probe Force Microscopy (KPFM), Scanning Capacitance Microscopy (SCM), Scanning Spreading Resistance Microscopy (SSRM) and other electrical scanning probe microscopy applications requiring high electrical conductivity together with excellent spatial resolution.
Typical applications include:
Key Benefits
