Same mechanical properties as OLYMPUS** AC160 - Optimized positioning through maximized tip visibility
NanoWorld Arrow™ ACR AFM probes have the same mechanical properties as the discontinued OLYMPUS** AC160 microcantilevers and are designed for non-contact or tapping™ mode imaging in air.
NanoWorld Arrow™ ACR AFM probes are general purpose AFM tips that can be used as a direct replacement for OLYMPUS** AC160 AFM probes for materials science applications. Due to their moderate stiffness these probes may be used for investigating relatively soft materials such as some polymers. In general, they are designed for non-contact or Tapping™ mode in air to characterize thin films, coatings, surface roughness, or local defects.
This AFM probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
All SPM and AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM probes feature a rectangular AFM cantilever with a triangular free end and a tetrahedral AFM tip.
Additionally, this probe offers an excellent tip radius of curvature.
The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the AFM tip on the area of interest.
