AFM Probes »

Q-Cond-E

Order Code / Price*

Quantity

Q-Cond-E-10 Box of 10 AFM Probes

350 350.00 USD

Price shown as ex-works and subjected to shipping charges, insurance, local VAT and custom duties respectively where applicable

AFM probe premounted on a T-Plate for Quesant / Ambios AFM systems

Side view SEM image of platinum (Pt) coated AFM tip

Front view SEM image of uncoated AFM tip

Q-Cond-E

Name: Q-Cond-E-10 Premounted Electrical, Contact Mode AFM Probe, for Quesant/Ambios AFM systems
Brand: BudgetSensors
SKU: Q-Cond-E-10
Price: 350 USD
Availability: InStock

Premounted Electrical, Contact Mode AFM Probe, for Quesant/Ambios AFM systems

Manufacturer: BudgetSensors

Coating: Electrically Conductive
AFM tip shape: Rotated

AFM Cantilever

F 13 kHz

C 0.2 N/m

L 450 µm

*nominal values

Applications

Premounted AFM Probes

How to optimize AFM scan parameters

How to use standard AFM Probes on Park AFM Systems

Monolithic silicon AFM probe for contact mode and lateral force mode operation and electric modes such as:

scanning capacitance microscopy (SCM)
scanning probe lithography

The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.

Consistent high quality at a lower price!

Premounted AFM probe on a Quesant T-plate for Quesant AFM systems. Based on a BudgetSensors ElectriCont-G AFM probe.

Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.

AFM Tip:

Shape: Rotated

Height: 17 µm (15 - 19 µm)*

Setback: 15 µm (10 - 20 µm)*

Radius: < 25 nm

Half Cone Angle: 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

AFM Cantilever:

Shape: Beam

Force Constant: 0.2 N/m (0.07 - 0.4 N/m)*

Resonance Frequency: 13 kHz (9 - 17 kHz)*

Length: 450 µm (440 - 460 µm)*

Width: 50 µm (45 - 55 µm)*

Thickness: 2 µm ( 1 - 3 µm)*

* typical range