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Quantity
240AC-NA-10 Box of 10 AFM Probes
295.00 USD
240AC-NA-50 Box of 50 AFM Probes
1100.00 USD
Your volume discount is 375.00 USD or 25.40%
240AC-NA-100 Box of 100 AFM Probes
1880.00 USD
Your volume discount is 1070.00 USD or 36.30%
Price shown as ex-works and subjected to shipping charges, insurance, local VAT and custom duties respectively where applicable
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240AC-NA

top value

Force Modulation AFM Probe with AFM Tip at the Very End of the AFM Cantilever

Manufacturer: OPUS by MikroMasch

Coating: Reflective Aluminum
AFM tip shape: Optimized Positioning
AFM Cantilever
F 70 kHz
C 2 N/m
L 240 µm
*nominal values
Applications
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The 240AC series of AFM probes is designed for tapping mode AFM imaging of soft samples.

The uncoated AFM tip offers a sharp tip apex and chemical inertness. The aluminum reflective coating enhances laser reflectivity in air and UHV.

The tetrahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface.

This AFM probe features alignment grooves on the back side of the holder chip.

30 nm Al on the back side of the cantilever
AFM Tip:

  • AFM Cantilever:
  • Beam
  • 2 N/m (0.6 - 3.9 N/m)*
  • 70 kHz (45 - 90 kHz)*
  • 240 µm (230 - 250 µm)*
  • 40 µm (38 - 42 µm)*
  • 2.6 µm ( 2.1 - 3.1 µm)*
  • * typical range
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