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Conductive Dynamic Mode AFM Probes
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Conductive Dynamic Mode AFM Probes

Electrical characterization in dynamic mode operation (EFM, KPFM, etc.)
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HQ:XSC11/Pt MikroMasch
HQ:XSC11/Pt
AFM Probe with 4 Different Electrical Cantilevers
Coating: Electrically Conductive
Tip Shape: Rotated
AFM Cantilevers: 4
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350 kHz
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42 N/m
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NANOSENSORS™ Special Developments List (SDL) NANOSENSORS
NANOSENSORS™ Special Developments List (SDL)
Special AFM Probes etc. Showcasing NANOSENSORS™ Expertise
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