AFM Probes »

ARROW-CONTPt

Order Code / Price*

Quantity

ARROW-CONTPt-10 Box of 10 AFM Probes

417 417.00 EUR

Volume Discount Available [?]

ARROW-CONTPt-20 Box of 20 AFM Probes

743 743.00 EUR

Your volume discount is 91.00 EUR or 10.90%

ARROW-CONTPt-50 Box of 50 AFM Probes

1643 1643.00 EUR

Your volume discount is 442.00 EUR or 21.20%

ARROW-CONTPt-W Box of 380 AFM Probes

8828 8828.00 EUR

Your volume discount is 7018.00 EUR or 44.30%

Price shown as ex-works and subjected to shipping charges, insurance, local VAT and custom duties respectively where applicable

Top view SEM image of ARROW™ AFM cantilever

SEM images of ARROW™ AFM tip

ARROW-CONTPt

Electrical, Contact Mode AFM Probe with Tip at the Very End of the Cantilever

Manufacturer: NanoWorld

Coating: Electrically Conductive
AFM tip shape: Arrow

AFM Cantilever

F 14 kHz

C 0.2 N/m

L 450 µm

*nominal values

Applications

Conductive AFM Probes

How to optimize AFM scan parameters

How to use on Bruker® AFM systems

How to use standard AFM Probes on Park AFM Systems

Optimized positioning through maximized tip visibility

NanoWorld Arrow™ CONTPt AFM probes are designed for Contact Mode imaging. Furthermore this type can be used for Force Distance Spectroscopy Mode or Pulsed Force Mode (PFM). The CONT type is optimized for high sensitivity due to a low Force Constant.

All AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. These AFM probes feature a rectangular AFM cantilever with a triangular free end and a tetrahedral AFM tip.

Additionally, this probe offers an excellent tip radius of curvature.

The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the AFM tip on the area of interest.

PtIr5 Coating

The PtIr5 coating consists of a 23 nm thick platinum iridium5 layer deposited on both sides of the AFM cantilever. The tip side coating enhances the conductivity of the AFM tip and allows electrical contacts. The detector side coating enhances the reflectance of the laser beam by a factor of 2 and prevents light from interfering within the AFM cantilever.

The coating process is optimized for stress compensation and wear resistance. Wear at the AFM tip can occur if operating in contact-, friction- or force modulation mode. As the coating is almost stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

AFM Tip:

Shape: Arrow

Radius: < 25 nm

AFM Cantilever:

Shape: Beam

Force Constant: 0.2 N/m (0.06 - 0.38 N/m)*

Resonance Frequency: 14 kHz (10 - 19 kHz)*

Length: 450 µm (445 - 455 µm)*

Width: 45 µm (40 - 50 µm)*

Thickness: 2 µm ( 1.5 - 2.5 µm)*

* typical range

Interested in learning about how this AFM probe has been used by fellow researchers?

Visit the manufacturer’s website for a list of publications mentioning this AFM probe.