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AFM Probes  »  
ARROW-CONTPt
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Order Code / Price*
Quantity
ARROW-CONTPt-10 Box of 10 AFM Probes
452.00 USD
Volume Discount Available [?]
ARROW-CONTPt-20 Box of 20 AFM Probes
806.00 USD
Your volume discount is 98.00 USD or 10.80%
ARROW-CONTPt-50 Box of 50 AFM Probes
1783.00 USD
Your volume discount is 477.00 USD or 21.10%
ARROW-CONTPt-W Box of 380 AFM Probes
9488.00 USD
Your volume discount is 7688.00 USD or 44.80%
Product availability: On stock
Top view SEM image of ARROW™ AFM cantilever
SEM images of ARROW™ AFM tip

ARROW-CONTPt

Electrical, Contact Mode AFM Probe with Tip at the Very End of the Cantilever

Manufacturer: NanoWorld

Coating: Electrically Conductive
AFM tip shape: Arrow
AFM Cantilever
F 14 kHz
C 0.2 N/m
L 450 µm
*nominal values
Applications
How to optimize AFM scan parameters gear icon
How to use on Bruker® AFM systems gear icon
Optimized positioning through maximized tip visibility

NanoWorld Arrow™ CONTPt AFM probes are designed for Contact Mode imaging. Furthermore this type can be used for Force Distance Spectroscopy Mode or Pulsed Force Mode (PFM). The CONT type is optimized for high sensitivity due to a low Force Constant.

All AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. These AFM probes feature a rectangular AFM cantilever with a triangular free end and a tetrahedral AFM tip.

Additionally, this probe offers an excellent tip radius of curvature.

The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the AFM tip on the area of interest.

PtIr5 Coating

The PtIr5 coating consists of a 23 nm thick platinum iridium5 layer deposited on both sides of the AFM cantilever. The tip side coating enhances the conductivity of the AFM tip and allows electrical contacts. The detector side coating enhances the reflectance of the laser beam by a factor of 2 and prevents light from interfering within the AFM cantilever.

The coating process is optimized for stress compensation and wear resistance. Wear at the AFM tip can occur if operating in contact-, friction- or force modulation mode. As the coating is almost stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.
AFM Tip:

    • AFM Cantilever:
  • Beam
  • 0.2 N/m (0.06 - 0.38 N/m)*
  • 14 kHz (10 - 19 kHz)*
  • 450 µm (445 - 455 µm)*
  • 45 µm (40 - 50 µm)*
  • 2 µm ( 1.5 - 2.5 µm)*
    • * typical range
    Interested in learning about how this AFM probe has been used by fellow researchers?
    Visit the manufacturer’s website for a list of publications mentioning this AFM probe.

    View this product on manufacturer's website
    Learn more about this and other AFM Tips
    Learn more about this and other AFM Cantilevers
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