AFM Probes » ARROW-CONTPt

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ARROW-CONTPt-10 Box of 10 AFM Probes
407.00 USD
Volume Discount Available [?]
ARROW-CONTPt-20 Box of 20 AFM Probes
726.00 USD
Your volume discount is 88.00 USD or 10.80%
ARROW-CONTPt-50 Box of 50 AFM Probes
1 606.00 USD
Your volume discount is 429.00 USD or 21.10%
ARROW-CONTPt-W Box of 380 AFM Probes
8 250.00 USD
Your volume discount is 7 216.00 USD or 46.70%
Product availability: On stock
Top view SEM image of ARROW AFM cantilever
SEM images of ARROW AFM tip

ARROW-CONTPt

Electrical, Contact Mode AFM Probe with Tip at the Very End of the Cantilever

Manufacturer: NanoWorld

Coating: Electrically Conductive
AFM tip shape: Arrow
AFM cantilever:
F 14 kHz
C 0.2 N/m
L 450 µm
*nominal values

Applications

Optimized positioning through maximized tip visibility

NanoWorld Arrow™ CONTPt AFM probes are designed for Contact Mode imaging. Furthermore this type can be used for Force Distance Spectroscopy Mode or Pulsed Force Mode (PFM). The CONT type is optimized for high sensitivity due to a low Force Constant.

All AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. These probes feature a rectangular cantilever with a triangular free end and a tetrahedral tip.

Additionally, this probe offers an excellent tip radius of curvature.

The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the tip on the area of interest.

PtIr5 Coating

The PtIr5 coating consists of a 23 nm thick platinum iridium5 layer deposited on both sides of the cantilever. The tip side coating enhances the conductivity of the tip and allows electrical contacts. The detector side coating enhances the reflectance of the laser beam by a factor of 2 and prevents light from interfering within the cantilever.

The coating process is optimized for stress compensation and wear resistance. Wear at the tip can occur if operating in contact-, friction- or force modulation mode. As the coating is almost stress-free the bending of the cantilever due to stress is less than 2 degrees.

AFM Tip:


    • AFM Cantilever:

  • Beam
  • 0.2 N/m (0.06 - 0.38 N/m)*
  • 14 kHz (10 - 19 kHz)*
  • 450 µm (445 - 455 µm)*
  • 45 µm (40 - 50 µm)*
  • 2 µm ( 1.5 - 2.5 µm)*
    • * typical range

    View this product on manufacturer's website
    Learn more about this and other AFM Tips
    Learn more about this and other AFM Cantilevers
    Similar Cantilevers: Rectangular / Diving Board AFM Cantilevers Trapezoidal Cross Section AFM Cantilevers (tip on narrow flank) Silicon AFM Cantilevers 1 Single AFM Cantilever per AFM Probe Platinum/Iridium Coated AFM Cantilevers
    Similar Tips: AFM Tips Positioned at the Very End of the Cantilever 3-sided Sharpened Pyramidal AFM Tips Silicon AFM Tips Platinum/Iridium Coated AFM Tips
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