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Order Code / Price*
Quantity
NW-DT-NCHR-10 Box of 10 AFM Probes
1220.00 USD
NW-DT-NCHR-20 Box of 20 AFM Probes
2183.00 USD
Your volume discount is 257.00 USD or 10.50%
NW-DT-NCHR-50 Box of 50 AFM Probes
4817.00 USD
Your volume discount is 1283.00 USD or 21.00%
Price shown as ex-works and subjected to shipping charges, insurance, local VAT and custom duties respectively where applicable

NW-DT-NCHR

the industry standard

Diamond Coated Tapping Mode AFM Probe

Manufacturer: NanoWorld

Coating: Diamond
AFM tip shape: Standard
AFM Cantilever
F 400 kHz
C 80 N/m
L 125 µm
*nominal values
Applications
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NanoWorld Pointprobe® NCH AFM probes are designed for non-contact or tapping mode imaging. This AFM probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

All AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.

For applications that require hard contact between tip and sample this probe offers a real diamond tip-side coating. This coating features extremely high wear resistance due to the unsurpassed hardness of diamond.

The typical macroscopic tip radius of curvature lies in the range between 100 and 200 nm. Nanoroughnesses in the 10 nm regime improve the resolution on flat surfaces.

For applications requiring lower resonance frequencies or a AFM cantilever length exceeding 125 µm use NanoWorld Pointprobe type DT-NCLR.

This AFM probe features alignment grooves on the back side of the holder chip.

Diamond Coating / Aluminum Reflex Coating

The diamond coating consists of a 100 nm thick polycrystalline diamond layer deposited on the tip side of the AFM cantilever resulting in an unsurpassed hardness of the AFM tip.

The aluminum reflex coating deposited on the detector side of the AFM cantilever enhances the reflectance of the laser beam and prevents light from interfering within the AFM cantilever.
AFM Tip:

  • AFM Cantilever:
  • Beam
  • 80 N/m (42 - 142 N/m)*
  • 400 kHz (280 - 510 kHz)*
  • 125 µm (120 - 130 µm)*
  • 30 µm (25 - 35 µm)*
  • 4 µm ( 3.5 - 4.5 µm)*
  • * typical range
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