NanoWorld Pointprobe® NCH AFM probes are designed for non-contact or tapping™ mode imaging. This AFM probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
All AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.
For applications that require hard contact between tip and sample this probe offers a real diamond tip-side coating. This coating features extremely high wear resistance due to the unsurpassed hardness of diamond.
The typical macroscopic tip radius of curvature lies in the range between 100 and 200 nm. Nanoroughnesses in the 10 nm regime improve the resolution on flat surfaces.
For applications requiring lower resonance frequencies or a AFM cantilever length exceeding 125 µm use NanoWorld Pointprobe type DT-NCLR.
This AFM probe features alignment grooves on the back side of the holder chip.