AFM cantilevers of the 14 series are generally used in tapping mode for imaging relatively soft samples to obtain better phase contrast and reduce surface deformations caused by the tapping AFM tip . AFM probes with coatings can also be used in conductive AFM techniques.
This AFM probe features alignment grooves on the back side of the holder chip.
Polymer Spherulite on Mica. 10 µm topography scan. Image obtained on Smart SPM ( AIST-NT Inc, Novato, CA).
Scanned with a MikroMasch HQ:NSC14/Al BS
Image courtesy of Fedor Kraev UC Davis
Scanned with a MikroMasch HQ:NSC14/Al BS AFM probe, 20 micron scan size
Image courtesy of Dr. Penka Terziyska, Innovative Solutions Bulgaria
