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Order Code / Price*
Quantity
SSS-FM-10 Box of 10 AFM Probes
900.00 USD
SSS-FM-50 Box of 50 AFM Probes
3550.00 USD
Your volume discount is 950.00 USD or 21.10%
Price shown as ex-works and subjected to shipping charges, insurance, local VAT and custom duties respectively where applicable

SSS-FM

SuperSharp, Force Modulation AFM Probe

Manufacturer: NANOSENSORS

Coating: none
AFM tip shape: Supersharp
AFM Cantilever
F 75 kHz
C 2.8 N/m
L 225 µm
*nominal values
Applications
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NANOSENSORSSSS-FM AFM probes are designed for force modulation mode.

For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ AFM tip with unrivalled sharpness.

The FM type is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. The SSS-FM AFM tip serves also as a basis for high resolution AFM tips with magnetic coatings SSS-MFMR. Furthermore non-contact or tapping mode operation is possible with the FM AFM tip but with reduced operation stability.

The AFM probe offers unique features:

  • excellent AFM tip radius of curvature
  • typical aspect ratio at 200 nm from AFM tip apex in the order of 4:1
  • monolithic material
  • highly doped to dissipate static charge
  • chemically inert
  • high mechanical Q-factor for high sensitivity

Uncoated
AFM Tip:

  • AFM Cantilever:
  • Beam
  • 2.8 N/m (0.5 - 9.5 N/m)*
  • 75 kHz (45 - 115 kHz)*
  • 225 µm (215 - 235 µm)*
  • 30 µm (20 - 35 µm)*
  • 3 µm ( 2 - 4 µm)*
  • * guaranteed range
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