AFM Probes » SSS-FM

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Order Code / Price*
Quantity
SSS-FM-10 Box of 10 AFM Probes
757.00 USD
SSS-FM-50 Box of 50 AFM Probes
2 988.00 USD
Your volume discount is 797.00 USD or 21.10%
Product availability: On stock

SSS-FM

SuperSharp, Force Modulation AFM Probe

Coating: none
Tip shape: Supersharp
Cantilever:
F 75 kHz
C 2.8 N/m
L 225 µm
*nominal values

Applications

NANOSENSORSSSS-FM AFM probes are designed for force modulation mode.

For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.

The FM type is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. The SSS-FM tip serves also as a basis for high resolution tips with magnetic coatings SSS-MFMR. Furthermore non-contact or tapping mode operation is possible with the FM tip but with reduced operation stability.

The probe offers unique features:

  • excellent tip radius of curvature
  • typical aspect ratio at 200 nm from tip apex in the order of 4:1
  • monolithic material
  • highly doped to dissipate static charge
  • chemically inert
  • high mechanical Q-factor for high sensitivity

Uncoated

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 2.8 N/m (0.5 - 9.5 N/m)*
  • 75 kHz (45 - 115 kHz)*
  • 225 µm (215 - 235 µm)*
  • 30 µm (20 - 35 µm)*
  • 3 µm (2 - 4 µm)*
  • * typical range
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