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HiRes-C19/Cr-Au-5 Box of 5 AFM Probes
495.00 USD
Price shown as ex-works and subjected to shipping charges, insurance, local VAT and custom duties respectively where applicable
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High Resolution, Soft Tapping Mode AFM Probe

Manufacturer: MikroMasch

Coating: Reflective Gold
AFM tip shape: Supersharp
AFM Cantilever
F 65 kHz
C 0.5 N/m
L 125 µm
*nominal values
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AFM cantilevers of the 19 series combine the high frequency and low force constant, which makes them suitable for imaging soft and fragile surfaces at a relatively high speed in Tapping mode. They are compatible with Bruker ScanAsyst® PeakForce Tapping™*. These AFM cantilevers are also used for Lateral force microscopy LFM due to their high sensitivity to the lateral forces.

High-resolution AFM probe with a hydrophobic diamond-like extratip at the apex of the silicon etched AFM probe.

This AFM probe features alignment grooves on the back side of the holder chip.

Cr-Au coating on both sides of the AFM cantilever. The coating does not cover the extratip!
AFM Tip:

  • AFM Cantilever:
  • Beam
  • 0.5 N/m (0.05 - 2.3 N/m)*
  • 65 kHz (25 - 120 kHz)*
  • 125 µm (120 - 130 µm)*
  • 22.5 µm (19.5 - 25.5 µm)*
  • 1 µm ( 0.5 - 1.5 µm)*
  • * typical range