AFM Probes »

HiRes-C19/Cr-Au

Order Code / Price*

Quantity

HiRes-C19/Cr-Au-5 Box of 5 AFM Probes

495 495.00 USD

Price shown as ex-works and subjected to shipping charges, insurance, local VAT and custom duties respectively where applicable

Close-up SEM image of high resolution MikroMasch HiRes-C AFM probe tip

AFM cantilever of MikroMasch lateral force microscopy AFM probe

AFM tip of MikroMasch lateral force microscopy AFM probe

Schematic of single lever MikroMasch® AFM Probe

HiRes-C19/Cr-Au

Name: HiRes-C19/Cr-Au-5 High Resolution, Soft Tapping Mode AFM Probe
Brand: MikroMasch
SKU: HiRes-C19/Cr-Au-5
Price: 495 USD
Availability: InStock

High Resolution, Soft Tapping Mode AFM Probe

Manufacturer: MikroMasch

Coating: Reflective Gold
AFM tip shape: Supersharp

AFM Cantilever

F 65 kHz

C 0.5 N/m

L 125 µm

*nominal values

Applications

How to optimize AFM scan parameters

How to use on Bruker® AFM systems

How to use standard AFM Probes on Park AFM Systems

AFM cantilevers of the 19 series combine the high frequency and low force constant, which makes them suitable for imaging soft and fragile surfaces at a relatively high speed in Tapping mode. They are compatible with Bruker ScanAsyst® PeakForce Tapping™*. These AFM cantilevers are also used for Lateral force microscopy LFM due to their high sensitivity to the lateral forces.

High-resolution AFM probe with a hydrophobic diamond-like extratip at the apex of the silicon etched AFM probe.

This AFM probe features alignment grooves on the back side of the holder chip.

Cr-Au coating on both sides of the AFM cantilever. The coating does not cover the extratip!

AFM Tip:

Shape: Supersharp

Height: 15 µm (12 - 18 µm)*

Radius: < 1 nm

AFM Cantilever:

Shape: Beam

Force Constant: 0.5 N/m (0.05 - 2.3 N/m)*

Resonance Frequency: 65 kHz (25 - 120 kHz)*

Length: 125 µm (120 - 130 µm)*

Width: 22.5 µm (19.5 - 25.5 µm)*

Thickness: 1 µm ( 0.5 - 1.5 µm)*

* typical range