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HiRes-C19/Cr-Au-5 Box of 5 AFM Probes
495.00 USD
Product availability: On stock
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HiRes-C19/Cr-Au

High Resolution, Soft Tapping Mode AFM Probe

Manufacturer: MikroMasch

Coating: Reflective Gold
AFM tip shape: Supersharp
AFM Cantilever
F 65 kHz
C 0.5 N/m
L 125 µm
*nominal values
Applications
How to optimize AFM scan parameters gear icon
AFM cantilevers of the 19 series combine the high frequency and low force constant, which makes them suitable for imaging soft and fragile surfaces at a relatively high speed in Tapping mode. They are compatible with Bruker ScanAsyst® PeakForce Tapping™*. These AFM cantilevers are also used for Lateral force microscopy LFM due to their high sensitivity to the lateral forces.

High-resolution AFM probe with a hydrophobic diamond-like extratip at the apex of the silicon etched AFM probe.

This AFM probe features alignment grooves on the back side of the holder chip.

Cr-Au coating on both sides of the AFM cantilever. The coating does not cover the extratip!
AFM Tip:

  • AFM Cantilever:
  • Beam
  • 0.5 N/m (0.05 - 2.3 N/m)*
  • 65 kHz (25 - 120 kHz)*
  • 125 µm (120 - 130 µm)*
  • 22.5 µm (19.5 - 25.5 µm)*
  • 1 µm ( 0.5 - 1.5 µm)*
  • * typical range
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