AFM Probes »

HQ:CSC17/Pt

Order Code / Price*

Quantity

HQ:CSC17/Pt-15 Box of 15 AFM Probes

345 345.00 EUR

Volume Discount Available [?]

HQ:CSC17/Pt-50 Box of 50 AFM Probes

990 990.00 EUR

Your volume discount is 160.00 EUR or 13.90%

HQ:CSC17/Pt-100 Box of 100 AFM Probes

1800 1800.00 EUR

Your volume discount is 500.00 EUR or 21.70%

Price shown as ex-works and subjected to shipping charges, insurance, local VAT and custom duties respectively where applicable

AFM tip of MikroMasch contact mode AFM probe

AFM cantilever of MikroMasch contact mode AFM probe

SEM image of platinum coated AFM probe tip close-up

Schematic of single lever MikroMasch® AFM Probe

HQ:CSC17/Pt

Electrical, Contact Mode AFM Probe

Manufacturer: MikroMasch

Coating: Electrically Conductive
AFM tip shape: Rotated

AFM Cantilever

F 13 kHz

C 0.18 N/m

L 450 µm

*nominal values

Applications

Conductive AFM Probes

How to optimize AFM scan parameters

How to use standard AFM Probes on Park AFM Systems

AFM cantilevers of the 17 series with low force constant offer high sensitivity in contact mode AFM. These AFM cantilevers are also used for Lateral Force Microscopy.

AFM probes with overall conductive chemically inert 30 nm Pt coating on the tip and back side of the AFM cantilever. The resulting AFM probe tip radius is about 30 nm.

The monolithic silicon HQ AFM probes offer high consistency of the AFM tip radius, cantilever reflectivity and quality factor.

This AFM probe features alignment grooves on the back side of the holder chip.

The 30 nm conductive Pt coating is continuous from the tip end to the bulk of the silicon chip. The coating covers both the tip and the back side of the AFM cantilever.

AFM Tip:

Shape: Rotated

Height: 15 µm (12 - 18 µm)*

Full Cone Angle: 40°

Radius: < 30 nm

AFM Cantilever:

Shape: Beam

Force Constant: 0.18 N/m (0.06 - 0.4 N/m)*

Resonance Frequency: 13 kHz (10 - 17 kHz)*

Length: 450 µm (445 - 455 µm)*

Width: 50 µm (47 - 53 µm)*

Thickness: 2 µm ( 1.5 - 2.5 µm)*

* typical range