AFM Probes » HQ:CSC17/Pt

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Order Code / Price*
HQ:CSC17/Pt-15 Box of 15 AFM Probes
380.00 USD
HQ:CSC17/Pt-50 Box of 50 AFM Probes
1000.00 USD
Your volume discount is 266.67 USD or 21.10%
HQ:CSC17/Pt-100 Box of 100 AFM Probes
1800.00 USD
Your volume discount is 733.33 USD or 28.90%
Product availability: On stock
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Electrical, Contact Mode AFM Probe

Manufacturer: MikroMasch

Coating: Electrically Conductive
AFM tip shape: Rotated
AFM Cantilever
F 13 kHz
C 0.18 N/m
L 450 µm
*nominal values


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AFM cantilevers of the 17 series with low force constant offer high sensitivity in contact mode AFM. These AFM cantilevers are also used for Lateral Force Microscopy.

AFM probes with overall conductive chemically inert 30 nm Pt coating on the tip and back side of the AFM cantilever. The resulting AFM probe tip radius is about 30 nm.

This product features alignment grooves on the back side of the holder chip.

The 30 nm conductive Pt coating is continuous from the tip end to the bulk of the silicon chip. The coating covers both the tip and the back side of the AFM cantilever.

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 0.18 N/m (0.06 - 0.4 N/m)*
  • 13 kHz (10 - 17 kHz)*
  • 450 µm (445 - 455 µm)*
  • 50 µm (47 - 53 µm)*
  • 2 µm ( 1.5 - 2.5 µm)*
  • * typical range