AFM Probes » HQ:CSC17/Pt

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HQ:CSC17/Pt-15 Box of 15 AFM Probes
360.00 USD
Volume Discount Available [?]
HQ:CSC17/Pt-50 Box of 50 AFM Probes
900.00 USD
Your volume discount is 300.00 USD or 25.00%
HQ:CSC17/Pt-100 Box of 100 AFM Probes
1 620.00 USD
Your volume discount is 780.00 USD or 32.50%
Product availability: On stock
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HQ:CSC17/Pt

Electrical, Contact Mode AFM Probe

Manufacturer: MikroMasch

Coating: Electrically Conductive
AFM tip shape: Rotated
AFM Cantilever
F 13 kHz
C 0.18 N/m
L 450 µm
*nominal values

Applications

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AFM cantilevers of the 17 series with low force constant offer high sensitivity in contact mode AFM. These AFM cantuilevers are also used for Lateral Force Microscopy.

AFM probes with overall conductive chemically inert 30 nm Pt coating on the tip and back side of the AFM cantilever. The resulting AFM probe tip radius is about 30 nm.

This product features alignment grooves on the back side of the holder chip.

The 30 nm conductive Pt coating is continuous from the tip end to the bulk of the silicon chip. The coating covers both the tip and the back side of the AFM cantilever.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 0.18 N/m (0.06 - 0.4 N/m)*
  • 13 kHz (10 - 17 kHz)*
  • 450 µm (445 - 455 µm)*
  • 50 µm (47 - 53 µm)*
  • 2 µm ( 1.5 - 2.5 µm)*
  • * typical range
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