AFM cantilevers of the 17 series with low force constant offer high sensitivity in contact mode AFM. These AFM cantilevers are also used for Lateral Force Microscopy.
AFM probes with overall conductive chemically inert 30 nm Au coating with 20 nm Cr sublayer on the tip and back side of the AFM cantilever. The resulting AFM probe tip radius is below 35 nm. The coating may cause AFM cantilever bending within 3°.
The monolithic silicon HQ AFM probes offer high consistency of the AFM tip radius, cantilever reflectivity and quality factor.
This AFM probe features alignment grooves on the back side of the holder chip.
