AFM Probes  »  
 Request a quote (RFQ)
Order Code / Price*
HQ:CSC17/Cr-Au-15 Box of 15 AFM Probes
420.00 EUR
HQ:CSC17/Cr-Au-50 Box of 50 AFM Probes
1200.00 EUR
Your volume discount is 200.00 EUR or 14.30%
HQ:CSC17/Cr-Au-100 Box of 100 AFM Probes
2050.00 EUR
Your volume discount is 750.00 EUR or 26.80%
Product availability: On stock
Get a free MikroMasch poster


Gold Coated Contact Mode AFM Probe

Manufacturer: MikroMasch

Coating: Gold Overall
AFM tip shape: Rotated
AFM Cantilever
F 13 kHz
C 0.18 N/m
L 450 µm
*nominal values
How to optimize AFM scan parameters gear icon

AFM cantilevers of the 17 series with low force constant offer high sensitivity in contact mode AFM. These AFM cantilevers are also used for Lateral Force Microscopy.

AFM probes with overall conductive chemically inert 30 nm Au coating with 20 nm Cr sublayer on the tip and back side of the AFM cantilever. The resulting AFM probe tip radius is below 35 nm. The coating may cause AFM cantilever bending within 3°.

This AFM probe features alignment grooves on the back side of the holder chip.

Cr-Au coating is formed as a 30 nm Au film with a 20 nm Cr sublayer, which is deposited for better adhesion of Au. The coating is formed on both tip side and back side of the AFM cantilever.
AFM Tip:

  • AFM Cantilever:
  • Beam
  • 0.18 N/m (0.06 - 0.4 N/m)*
  • 13 kHz (10 - 17 kHz)*
  • 450 µm (445 - 455 µm)*
  • 50 µm (47 - 53 µm)*
  • 2 µm ( 1.5 - 2.5 µm)*
  • * typical range