AFM Probes » HQ:CSC17/Cr-Au

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HQ:CSC17/Cr-Au-15 Box of 15 AFM Probes
360.00 USD
Volume Discount Available [?]
HQ:CSC17/Cr-Au-50 Box of 50 AFM Probes
900.00 USD
Your volume discount is 300.00 USD or 25.00%
HQ:CSC17/Cr-Au-100 Box of 100 AFM Probes
1 620.00 USD
Your volume discount is 780.00 USD or 32.50%
Product availability: On stock
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HQ:CSC17/Cr-Au

Gold Coated Contact Mode AFM Probe

Coating: (Au) Overall
Tip shape: Rotated
Cantilever:
F 13 kHz
C 0.18 N/m
L 450 µm
*nominal values

Applications

Cantilevers of the 17 series with the low spring constant are used in contact mode AFM mostly. It is possible to adjust the scanning parameters to minimize the tip-sample force. Imaging in tapping mode gives the true topography of the soft samples.

Probes with overall conductive chemically inert 30 nm Au coating with 20 nm Cr sublayer on the tip and backside of the cantilever. Resulting tip radius is below 35 nm. The coating may cause cantilever bending within 3°.

This product features alignment grooves on the back side of the holder chip.

Cr-Au coating is formed as a 30 nm Au film with a 20 nm Cr sublayer, which is deposited for better adhesion of Au. The coating is formed on both tipside and backside of the cantilever.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 0.18 N/m (0.06 - 0.4 N/m)*
  • 13 kHz (10 - 17 kHz)*
  • 450 µm
  • 50 µm
  • 2 µm
  • * typical range
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