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OMCL-AC200TS-C3 Box of 24 AFM Probes
799.00 EUR
OMCL-AC200TS-R3 Box of 100 AFM Probes
2350.00 EUR
Your volume discount is 979.17 EUR or 29.40%
Product availability: On stock



Soft Tapping Mode AFM Probe with AFM Tip at the Very End of the AFM Cantilever

Manufacturer: OLYMPUS

Coating: Reflective Aluminum
AFM tip shape: Optimized Positioning
AFM Cantilever
F 150 kHz
C 9 N/m
L 200 µm
*nominal values
How to optimize AFM scan parameters gear icon

The OLYMPUS OMCL-AC200TS series silicon AFM probes feature an AFM tip with ‘TipView structure’ that makes it easy to estimate the position of the AFM tip relative to the sample measurement site. The sharpened, tetrahedral, point-terminated AFM tip has very good symmetry when viewed from the front and is inclined when viewed from the side.

With their mid-range AFM cantilever mechanical properties of nom. 150kHz and nom. 9N/m the OLYMPUS OMCL-AC200TS can be used for a wide range of measurement samples such as silicon semiconductors, glass, metal and plastic materials.

The AFM probe is made of silicon with low resistivity in the range 0.1-0.4Ω.cm. The back side of the AFM cantilever is coated with a thin aluminum reflective coating.

The parallel sidewalls of the holder chip make handling with tweezers easy and eliminate problems with chipping and debris. The holder chip does not feature alignment grooves.

A thin aluminum film with the thickness of 100nm is deposited on the back side of the AFM cantilever for enhanced laser reflectivity.
AFM Tip:

  • AFM Cantilever:
  • 9 N/m (2.8 - 21 N/m)*
  • 150 kHz (100 - 200 kHz)*
  • 200 µm (180 - 220 µm)*
  • 40 µm (38 - 42 µm)*
  • 3.5 µm ( 2.9 - 4.1 µm)*
  • * typical range