AFM Info

AFM Probe Specification Ranges

In NanoAndMore Portfolio
  • 1 AFM Tip
    • 1 - 20000 nm
    • 2 - 50 µm
  • 2 AFM Cantilever
    • 6 - 5000 kHz
    • 0.01 - 2000 N/m
    • 7 - 500 µm
    • 0.8 - 120 µm
    • 0.08 - 7 µm
  • 3 Support Chip (handling)
    • 1.6 mm x 3.4 mm

* The property ranges above, as well as the AFM Probe Guide, include NANOSENSORS™ Special Developments List AFM probes that might not be listed in the regular range of AFM probes on NanoAndMore. Please contact us if you can’t find the AFM probe you are looking for via the search field – we’ll assist you gladly!

AFM Principle, AFM Measurements, AFM Application Modes

General information about the technique Atomic Force Microscopy (AFM), as well as information on different AFM measurement modes, AFM system settings and other helpful tips.

afm-explained-new scheme

What Is Atomic Force Microscopy (AFM) ?

Learn about the exciting technique for atomic resolution imaging and manipulation Atomic Force Microscopy! What is AFM? What is its operation principle? What AFM operation modes are there?

AFM Measurement Basics

AFM is a powerful measurement technique. This note is a general overview of the basic steps needed for performing a successful topography AFM measurement in contact or tapping mode on an AFM system with optical cantilever deflection detection.

AFM Tip Shape Effects

Images obtained by scanning a sample with an AFM tip are strongly dependent on the AFM tip geometry. AFM scans are a result of the convolution of the AFM tip and the surface. In order to understand how AFM images are formed and how they differ from the real surface topography, we need to know about AFM tip shape effects.

How to optimize AFM scan parameters

Need to know how to setup your AFM system for a new AFM probe? Check out our step-by-step instruction on how to optimize AFM scan parameters on almost any AFM system, using almost any AFM probe.

Contact vs Tapping Mode AFM

Тhe two most commonly used modes of AFM operation are contact mode and tapping mode. How do they differ? What are the advantages and disadvantages of each one?

High Speed Scanning AFM

A hot topic in AFM High Speed Scanning AFM (HSS AFM, HS AFM) measurements at up to video rates for in situ observation of dynamic processes. HSS AFM has been enabled by recent developments in instrumentation with high speed electronics and the development of advanced AFM cantilevers with megahertz resonance frequencies.

Magnetic Force Microscopy

Magnetic Force Microscopy (MFM) enables high-resolution imaging of the magnetic properties of different materials. When using an AFM probe with a magnetic coating on the tip side of the AFM cantilever, the AFM system can measure the magnetic field gradients above the sample surface.

AFM Probe Fabrication

Silicon AFM probes are ‘carved out’ from single-crystal silicon wafers. The wafers are patterned in a microfabrication process similar to the one used in silicon chip manufacturing. The fabrication process consists of more than 100 steps and it takes a couple of months to complete.