AFM Probes  »  
 Request a quote (RFQ)
Order Code / Price*
OMCL-AC240TM-B3 Box of 18 AFM Probes
720.00 EUR
OMCL-AC240TM-R3 Box of 100 AFM Probes
2790.00 EUR
Your volume discount is 1210.00 EUR or 30.30%
Product availability: On stock



Electrical, Force Modulation AFM Probe with AFM Tip at the Very End of the AFM Cantilever

Manufacturer: OLYMPUS

Coating: Electrically Conductive
AFM tip shape: Optimized Positioning
AFM Cantilever
F 70 kHz
C 2 N/m
L 240 µm
*nominal values
How to optimize AFM scan parameters gear icon

The OLYMPUS OMCL-AC240TM series silicon AFM probes feature an AFM tip with ‘TipView structure’ that makes it easy to estimate the position of the AFM tip relative to the sample measurement site. The sharpened, tetrahedral, point-terminated AFM tip has very good symmetry when viewed from the front and is inclined when viewed from the side.

The OLYMPUS OMCL-AC240TМ are most suitable for measurements of electrical properties such as Electrostatic Force Microscopy (EFM), Kelvin Probe Force Microscopy (KPFM) and Scanning Capacitance Microscopy (SCM).

The AFM tip and the tip side of the AFM cantilever are coated with platinum, which is a noble metal and exhibits good and stable conductivity. The back side of the AFM cantilever is coated with a thin aluminum reflective coating.

The parallel sidewalls of the holder chip make handling with tweezers easy and eliminate problems with chipping and debris. The holder chip does not feature alignment grooves.

A platinum layer is deposited on the silicon probe with the titanium interfacial layer. A thin aluminum film with the thickness of 100nm is deposited on the back side of the AFM cantilever for enhanced laser reflectivity.
AFM Tip:

  • AFM Cantilever:
  • 2 N/m (0.6 - 3.5 N/m)*
  • 70 kHz (45 - 95 kHz)*
  • 240 µm (220 - 260 µm)*
  • 40 µm (38 - 42 µm)*
  • 2.3 µm ( 1.6 - 3 µm)*
  • * typical range