AFM Probes »

Q-EFM

Order Code / Price*

Quantity

Q-EFM-10 Box of 10 AFM Probes

350 350.00 EUR

Product availability: Available on demand. Please contact us for availability!

AFM probe premounted on a T-Plate for Quesant / Ambios AFM systems

Front view SEM image of uncoated AFM tip

Side view SEM image of platinum (Pt) coated AFM tip

Q-EFM

Name: Q-EFM-10 Premounted Electrical, Force Modulation AFM Probe, for Quesant/Ambios AFM systems
Brand: BudgetSensors
SKU: Q-EFM-10
Price: 350 EUR
Availability: InStock

Premounted Electrical, Force Modulation AFM Probe, for Quesant/Ambios AFM systems

Manufacturer: BudgetSensors

Coating: Electrically Conductive
AFM tip shape: Rotated

AFM Cantilever

F 75 kHz

C 3 N/m

L 225 µm

*nominal values

Applications

Premounted AFM Probes

How to optimize AFM scan parameters

How to use standard AFM Probes on Park AFM Systems

Monolithic silicon AFM probe for force modulation and pulsed force mode (PFM), and electric modes such as:

scanning capacitance microscopy (SCM)
electrostatic force microscopy (EFM)
Kelvin probe force microscopy (KFM)

The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.

Consistent high quality at a lower price!

Premounted AFM probe on a Quesant T-plate for Quesant AFM systems. Based on BudgetSensors ElectriMulti75-G AFM probe.

Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.

AFM Tip:

Shape: Rotated

Height: 17 µm (15 - 19 µm)*

Setback: 15 µm (10 - 20 µm)*

Radius: < 10 nm

Half Cone Angle: 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

AFM Cantilever:

Shape: Beam

Force Constant: 3 N/m (1 - 7 N/m)*

Resonance Frequency: 75 kHz (60 - 90 kHz)*

Length: 225 µm (215 - 235 µm)*

Width: 28 µm (23 - 33 µm)*

Thickness: 3 µm ( 2 - 4 µm)*

* typical range