The OLTESPA is designed for AC mode AFM imaging of soft samples. The uncoated tip offers a sharp tip apex and chemical inertness. The back side aluminum coating significantly enhances the cantilever reflectivity. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.
OPUS™ AFM probes are made of monolithic silicon. Click here for more information.
This AFM probe features alignment grooves on the back side of the holder chip.
