Non-Contact / Tapping Mode AFM
General dynamic mode measurements
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Force Modulation (FM) AFM
Multi-functional probes
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Contact Mode AFM
General static mode measurements
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Life Science AFM
Biological applications
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Ultra High Frequency AFM
High speed scanning
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Conductive AFM
Electrical characterization (EFM, KPFM, SSRM, TUNA, etc.)
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Magnetic AFM
Magnetic force microscopy (MFM)
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Supersharp AFM
Enhanced / atomic resolution measurements
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Diamond AFM
The ultimate in hardness
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Hardened / Enhanced Wear Resistance AFM
Long scanning, hard samples
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Nanoindentation and Lithography AFM
Nanomechanics and Sample Modification
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High Aspect Ratio (HAR) AFM
Deep trench measurements
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PeakForce Tapping® AFM
Intermittent contact non-resonance measurements
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ScanAsyst®** AFM
ScanAsyst® compatible AFM probes
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Silicon Nitride AFM
Soft samples in air and liquid
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Lateral Force Microscopy (LFM) AFM
Frictional force measurements
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Tipless AFM Cantilevers and Cantilever Arrays
For functionalization and gluing spheres
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Self-Sensing & Self-Actuating AFM
The AFM technology of tomorrow
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Sphere AFM Tips and Colloidal AFM by sQube
Well defined sphere geometry for nanomechanics
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Platinum Silicide AFM
The ultimate probes for electrical characterization
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OLYMPUS*** Replacement AFM
For the discontinued Olympus AC55, AC160, AC240 and AC200 series
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Original and unaltered OLYMPUS AFM probes
Packaged and labeled by OLYMPUS in Japan!
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Premounted AFM
For Quesant / Ambios AFM systems
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